This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

Static-timing analysis (STA) has been one of the most pervasive and successful analysis
engines in the design of digital circuits for the last 20 years. However, in recent years, the …

The authors propose models for both temporal and spatial locality of reference in streams of
requests arriving at Web servers. They show that simple models based on document …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Purpose–Process variation has become a major concern in the design of many nanometer
circuits, including interconnect pipelines. The purpose of this paper is to provide a …

Abstract Small Delay Faults (SDFs) due to weak defects and marginalities have to be
distinguished from extra delays due to process variations, since they may form a reliability …

A smooth periodic delayed feedback (SPDF) control scheme is proposed for the fixed-time
stabilization problem of linear periodic systems subject to input delay. By investigating the …

Monolithic 3D (M3D) is an emerging heterogeneous integration technology that overcomes
the limitations of the conventional through-silicon-via (TSV) and provides significant …

Testing for small-delay defects (SDDs) requires fault-effect propagation along the longest
testable paths. However, identification of the longest testable paths requires high CPU time …

Functional microprocessor test methods provide several advantages compared to DFT
approaches, like reduced chip cost and at-speed execution. However, the automatic …