Electrostatic discharge (ESD) failures in high-speed integrated circuits (ICs) cause critical
reliability problems in electronic devices. Transient voltage suppressor (TVS) diodes are …

System-efficient electrostatic discharge (ESD) design (SEED) models of a diode and
transient voltage suppressor (TVS) were developed to study their transient response in a …

The ESD coupling path and on-board impedances strongly affect the ESD rise time seen on
a PCB trace. Possible race conditions between external and on-die ESD protection were …

With the shrinking dimension of technologies and safety requirements, electrostatic
discharge (ESD) protections play a more and more important role. Consequently, the …

Optimizing electrostatic discharge (ESD) protection strategies requires simulation models of
both on-and off-die ESD devices, but detailed information about on-die ESD protection is …

Accurate models of transient voltage suppression (TVS) devices are important for
determining the suitability of electrostatic discharge (ESD) protection strategies early in the …

Modeling ESD protection using the System Efficient ESD Design (SEED) methodology
enables optimal protection of an IO using TVS and external components. The success of …

Discrete transient voltage suppressor devices are used in addition to the on-chip ESD
protection to protect the ICs from ESD damage. In applications involving snapback TVS …

The traditional SPICE diode model does not fully characterize the response of transient
voltage suppressor (TVS) under transient electrostatic discharge (ESD) pulses. This paper …

A hybrid finite difference model for SCRs and open base transistors with a lowly doped
region is presented. It solves the diffusion and transport equation in a spice simulator. The …