A review on chemical and mechanical phenomena at the wafer interface during chemical mechanical planarization

J Seo - Journal of Materials Research, 2021 - Springer
As the minimum feature size of integrated circuit elements has shrunk below 7 nm, chemical
mechanical planarization (CMP) technology has grown by leaps and bounds over the past …

A review: green chemical mechanical polishing for metals and brittle wafers

L Liu, Z Zhang, B Wu, W Hu, F Meng… - Journal of Physics D …, 2021 - iopscience.iop.org
Chemical mechanical polishing (CMP) is the most effective technique to obtain global and
local planarization of metal and brittle surfaces. Conventionally, CMP slurries contain strong …

Environment friendly chemical mechanical polishing of copper

Z Zhang, J Cui, J Zhang, D Liu, Z Yu, D Guo - Applied Surface Science, 2019 - Elsevier
Chemical mechanical polishing slurry of copper usually contains more than four
compositions, in which strong acids, alkalis or hazardous chemicals are normally employed …

Benzotriazole corrosion inhibitor loaded nanocontainer based on g-C3N4 and hollow polyaniline spheres towards enhancing anticorrosion performance of …

C Li, C Zhang, Y He, H Li, Y Zhao, Z Li, D Sun… - Progress in Organic …, 2023 - Elsevier
Multi-dimensional composite nanocontainers provided an opportunity to prolong the service
life of waterborne self-healing coatings through combining intelligent protection with …

The effect of structural properties of benzo derivative on the inhibition performance for copper corrosion in alkaline medium: Experimental and theoretical …

W Li, T Ma, B Tan, S Zhang, M Yan, J Ji, F Wang… - Colloids and Surfaces A …, 2022 - Elsevier
As the most commonly used multilayer interconnect metal material of integrated circuits,
copper corrosion inhibition is a key technical problem in chemical mechanical polishing …

Examining amino acids as environmentally friendly corrosion inhibitors for Cu and Co chemical mechanical planarization

TTH Tran, J Gichovi, J Commane, EJ Podlaha… - Journal of Environmental …, 2024 - Elsevier
Aliphatic amino acids (AAs) were investigated as environmentally friendly alternatives to
benzotriazole (BTA) in the chemical mechanical planarization (CMP) process for Cu …

Corrosion control of copper wiring by barrier CMP slurry containing azole inhibitor: combination of simulation and experiment

T Ma, B Tan, Y Xu, D Yin, G Liu, N Zeng, G Song… - Colloids and Surfaces A …, 2020 - Elsevier
In the chemical mechanical polishing (CMP) process of barrier layer of multilayer copper
wiring in integrated circuits, it is necessary to add appropriate corrosion inhibitor into the …

In-depth research on azole corrosion inhibitors-effect of N atoms position and quantity on copper corrosion inhibition performance in alkaline environments …

R Liu, X Han, B Tan, W Li, F Wang, X Wang… - Colloids and Surfaces A …, 2024 - Elsevier
Copper's superior electrical properties make it ideal for multi-layer interconnections in
integrated circuits. Chemical mechanical polishing (CMP) is the main method for achieving …

Effect of arginine-based cleaning solution on BTA residue removal after Cu-CMP

Q Wang, D Yin, B Gao, S Tian, X Sun, M Liu… - Colloids and Surfaces A …, 2020 - Elsevier
In chemical mechanical polishing (CMP) process, surface defects and contamination will be
introduced on the wafer surface due to interfacial chemical reactions and abrasive particles …

Experimental and density functional theory study of complexing agents on cobalt dissolution in alkaline solutions

L Hu, X Zhang, H Wang, J Zhang, R **a, J Cao… - Electrochimica Acta, 2021 - Elsevier
Abstract Glycine (GLY), potassium tartrate (PT), and hydroxyethylidene diphosphonic acid
(HEDP) have been used as effective complexing agents for chemical mechanical polishing …