A review on chemical and mechanical phenomena at the wafer interface during chemical mechanical planarization
J Seo - Journal of Materials Research, 2021 - Springer
As the minimum feature size of integrated circuit elements has shrunk below 7 nm, chemical
mechanical planarization (CMP) technology has grown by leaps and bounds over the past …
mechanical planarization (CMP) technology has grown by leaps and bounds over the past …
A review: green chemical mechanical polishing for metals and brittle wafers
L Liu, Z Zhang, B Wu, W Hu, F Meng… - Journal of Physics D …, 2021 - iopscience.iop.org
Chemical mechanical polishing (CMP) is the most effective technique to obtain global and
local planarization of metal and brittle surfaces. Conventionally, CMP slurries contain strong …
local planarization of metal and brittle surfaces. Conventionally, CMP slurries contain strong …
Environment friendly chemical mechanical polishing of copper
Z Zhang, J Cui, J Zhang, D Liu, Z Yu, D Guo - Applied Surface Science, 2019 - Elsevier
Chemical mechanical polishing slurry of copper usually contains more than four
compositions, in which strong acids, alkalis or hazardous chemicals are normally employed …
compositions, in which strong acids, alkalis or hazardous chemicals are normally employed …
Benzotriazole corrosion inhibitor loaded nanocontainer based on g-C3N4 and hollow polyaniline spheres towards enhancing anticorrosion performance of …
C Li, C Zhang, Y He, H Li, Y Zhao, Z Li, D Sun… - Progress in Organic …, 2023 - Elsevier
Multi-dimensional composite nanocontainers provided an opportunity to prolong the service
life of waterborne self-healing coatings through combining intelligent protection with …
life of waterborne self-healing coatings through combining intelligent protection with …
The effect of structural properties of benzo derivative on the inhibition performance for copper corrosion in alkaline medium: Experimental and theoretical …
W Li, T Ma, B Tan, S Zhang, M Yan, J Ji, F Wang… - Colloids and Surfaces A …, 2022 - Elsevier
As the most commonly used multilayer interconnect metal material of integrated circuits,
copper corrosion inhibition is a key technical problem in chemical mechanical polishing …
copper corrosion inhibition is a key technical problem in chemical mechanical polishing …
Examining amino acids as environmentally friendly corrosion inhibitors for Cu and Co chemical mechanical planarization
Aliphatic amino acids (AAs) were investigated as environmentally friendly alternatives to
benzotriazole (BTA) in the chemical mechanical planarization (CMP) process for Cu …
benzotriazole (BTA) in the chemical mechanical planarization (CMP) process for Cu …
Corrosion control of copper wiring by barrier CMP slurry containing azole inhibitor: combination of simulation and experiment
T Ma, B Tan, Y Xu, D Yin, G Liu, N Zeng, G Song… - Colloids and Surfaces A …, 2020 - Elsevier
In the chemical mechanical polishing (CMP) process of barrier layer of multilayer copper
wiring in integrated circuits, it is necessary to add appropriate corrosion inhibitor into the …
wiring in integrated circuits, it is necessary to add appropriate corrosion inhibitor into the …
In-depth research on azole corrosion inhibitors-effect of N atoms position and quantity on copper corrosion inhibition performance in alkaline environments …
R Liu, X Han, B Tan, W Li, F Wang, X Wang… - Colloids and Surfaces A …, 2024 - Elsevier
Copper's superior electrical properties make it ideal for multi-layer interconnections in
integrated circuits. Chemical mechanical polishing (CMP) is the main method for achieving …
integrated circuits. Chemical mechanical polishing (CMP) is the main method for achieving …
Effect of arginine-based cleaning solution on BTA residue removal after Cu-CMP
Q Wang, D Yin, B Gao, S Tian, X Sun, M Liu… - Colloids and Surfaces A …, 2020 - Elsevier
In chemical mechanical polishing (CMP) process, surface defects and contamination will be
introduced on the wafer surface due to interfacial chemical reactions and abrasive particles …
introduced on the wafer surface due to interfacial chemical reactions and abrasive particles …
Experimental and density functional theory study of complexing agents on cobalt dissolution in alkaline solutions
L Hu, X Zhang, H Wang, J Zhang, R **a, J Cao… - Electrochimica Acta, 2021 - Elsevier
Abstract Glycine (GLY), potassium tartrate (PT), and hydroxyethylidene diphosphonic acid
(HEDP) have been used as effective complexing agents for chemical mechanical polishing …
(HEDP) have been used as effective complexing agents for chemical mechanical polishing …