Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook

M Botifoll, I Pinto-Huguet, J Arbiol - Nanoscale Horizons, 2022 - pubs.rsc.org
In the last few years, electron microscopy has experienced a new methodological paradigm
aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine …

Optical ptychography for biomedical imaging: recent progress and future directions

T Wang, S Jiang, P Song, R Wang, L Yang… - Biomedical Optics …, 2023 - opg.optica.org
Ptychography is an enabling microscopy technique for both fundamental and applied
sciences. In the past decade, it has become an indispensable imaging tool in most X-ray …

do: A differentiable engine for deep lens design of computational imaging systems

C Wang, N Chen, W Heidrich - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Computational imaging systems algorithmically post-process acquisition images either to
reveal physical quantities of interest or to increase image quality, eg, deblurring. Designing …

Illumination pattern design with deep learning for single-shot Fourier ptychographic microscopy

YF Cheng, M Strachan, Z Weiss, M Deb, D Carone… - Optics express, 2019 - opg.optica.org
Fourier ptychographic microscopy allows for the collection of images with a high space-
bandwidth product at the cost of temporal resolution. In Fourier ptychographic microscopy …

Noise-robust latent vector reconstruction in ptychography using deep generative models

J Seifert, Y Shao, AP Mosk - Optics Express, 2023 - opg.optica.org
Computational imaging is increasingly vital for a broad spectrum of applications, ranging
from biological to material sciences. This includes applications where the object is known …

Using automatic differentiation as a general framework for ptychographic reconstruction

S Kandel, S Maddali, M Allain, SO Hruszkewycz… - Optics express, 2019 - opg.optica.org
Coherent diffraction imaging methods enable imaging beyond lens-imposed resolution
limits. In these methods, the object can be recovered by minimizing an error metric that …

Three dimensions, two microscopes, one code: Automatic differentiation for x-ray nanotomography beyond the depth of focus limit

M Du, YSG Nashed, S Kandel, D Gürsoy… - Science advances, 2020 - science.org
Conventional tomographic reconstruction algorithms assume that one has obtained pure
projection images, involving no within-specimen diffraction effects nor multiple scattering …

Towards self-calibrated lens metrology by differentiable refractive deflectometry

C Wang, N Chen, W Heidrich - Optics Express, 2021 - opg.optica.org
Deflectometry, as a non-contact, fully optical metrology method, is difficult to apply to
refractive elements due to multi-surface entanglement and precise pose alignment. Here, we …

Time-resolved X-ray microscopy for materials science

H Wen, MJ Cherukara, MV Holt - Annual Review of Materials …, 2019 - annualreviews.org
X-ray microscopy has been an indispensable tool to image nanoscale properties for
materials research. One of its recent advances is extending microscopic studies to the time …

Ptychonet: Fast and high quality phase retrieval for ptychography

Z Guan, EH Tsai, X Huang, KG Yager, H Qin - 2019 - osti.gov
Ptychography is a coherent diffractive imaging method that captures multiple diffraction
patterns of a sample with a set of shifted localized illuminations (“probes”). The …