Radiation effects in microelectronic components have been studied for several decades for
military and space applications. Understanding radiation effects in electronics is a complex …

Ternary content addressable memories (TCAMs) are widely used in network devices to
implement packet classification. They are used, for example, for packet forwarding, for …

The ChipIr beamline at the Rutherford Appleton Laboratory (UK) is an atmospheric-like
neutron facility for Single Event Effect testing in Europe. ChipIr's design allows the extraction …

Fast and accurate soft error vulnerability assessment is an integral part of cost-effective
robust system design. The de facto approach is expensive fault simulation or emulation in …

Single Event Effects strongly impact the reliability of electronic circuits and systems,
requiring careful SER characterization and adequately sized mitigation strategy. The SER …

The material in this document reflects the collective views, ideas, opinions and findings of
the study participants only, and not those of any of the universities, corporations, or other …

Managing the effect of soft-errors in flip-flops is essential when designing reliable, silicon
intensive systems using current technologies. Develo** techniques and tools to accurately …

Single error correction (SEC) codes are widely used to protect data stored in memories and
registers. In some applications, such as networking, a few control bits are added to the data …

Statistical fault injection is widely used for analyzing hardware in the presence of soft errors.
Although this method can give accurate results for averaged erroneous outcomes with a …

Mobile agents is an important enabling technology for certain types of real world
applications such as e-commerce and workflows. While the potential benefits are appealing …