Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Emerging trends in surface metrology
Recent advancements and some emerging trends in the methods and instruments used for
surface and near surface characterisation are presented, considering the measurement of …
surface and near surface characterisation are presented, considering the measurement of …
[ספר][B] Scanning probe microscopy: the lab on a tip
E Meyer, R Bennewitz, HJ Hug - 2021 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …
Two-dimensional map** of the electrostatic potential in transistors by electron holography
We demonstrate the first successful map** of the two-dimensional electrostatic potential in
semiconductor transistor structures by electron holography. Our high resolution 2D phase …
semiconductor transistor structures by electron holography. Our high resolution 2D phase …
Secondary electron imaging as a two-dimensional dopant profiling technique: Review and update
D Venables, H Jain, DC Collins - … of Vacuum Science & Technology B …, 1998 - pubs.aip.org
Secondary electron (SE) imaging of semiconductors reveals contrast between n-and p-type
areas that can serve as the basis for a two-dimensional dopant profiling technique. In this …
areas that can serve as the basis for a two-dimensional dopant profiling technique. In this …
Ionic and electronic impedance imaging using atomic force microscopy
Localized alternating current (ac) impedance measurements are acquired directly through a
conductive atomic force microscope (AFM) tip. Both a spectroscopy mode (where full …
conductive atomic force microscope (AFM) tip. Both a spectroscopy mode (where full …
Quantitative impedance measurement using atomic force microscopy
Obtaining quantitative electrical information with scanning probe microscopy techniques
poses a significant challenge since the nature of the probe/sample contact is frequently …
poses a significant challenge since the nature of the probe/sample contact is frequently …
Cross-sectional nano-spreading resistance profiling
P De Wolf, T Clarysse, W Vandervorst… - Journal of Vacuum …, 1998 - pubs.aip.org
The nano-spreading resistance profiling (nano-SRP) method has been developed and
improved such that it can now be used as an accurate tool for quantitative two-dimensional …
improved such that it can now be used as an accurate tool for quantitative two-dimensional …
Quantitative analysis of one-dimensional dopant profile by electron holography
The one-dimensional dopant profile of a silicon p–n junction was characterized using off-
axis electron holography in a transmission electron microscope (TEM). Quantitative …
axis electron holography in a transmission electron microscope (TEM). Quantitative …
Advances in experimental technique for quantitative two-dimensional dopant profiling by scanning capacitance microscopy
VV Zavyalov, JS McMurray, CC Williams - Review of scientific …, 1999 - pubs.aip.org
Several advances have been made toward the achievement of quantitative two-dimensional
dopant and carrier profiling. To improve the dielectric and charge properties of the oxide …
dopant and carrier profiling. To improve the dielectric and charge properties of the oxide …
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities
Off-axis electron holography has evolved into a powerful electron-microscopy-based
technique for characterizing electromagnetic fields with nanometer-scale resolution. In this …
technique for characterizing electromagnetic fields with nanometer-scale resolution. In this …