Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS
In this paper, we have analyzed and modeled failure probabilities (access-time failure,
read/write failure, and hold failure) of synchronous random-access memory (SRAM) cells …
read/write failure, and hold failure) of synchronous random-access memory (SRAM) cells …
[LIBRO][B] Statistical analysis and optimization for VLSI: Timing and power
Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book
on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest …
on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest …
Benefits and costs of power-gating technique
H Jiang, M Marek-Sadowska… - … conference on computer …, 2005 - ieeexplore.ieee.org
Power-gating is a technique for saving leakage power by shutting off the idle blocks.
However, without good understanding and careful design, negative effects of power gating …
However, without good understanding and careful design, negative effects of power gating …
Hot spot cooling using embedded thermoelectric coolers
GJ Snyder, M Soto, R Alley, D Koester… - … -Second Annual IEEE …, 2006 - ieeexplore.ieee.org
Localized areas of high heat flux on microprocessors produce hot spots that limit their
reliability and performance. With increasingly dense circuits and the integration of high …
reliability and performance. With increasingly dense circuits and the integration of high …
[LIBRO][B] Low-power electronics design
C Piguet - 2018 - books.google.com
The power consumption of integrated circuits is one of the most problematic considerations
affecting the design of high-performance chips and portable devices. The study of power …
affecting the design of high-performance chips and portable devices. The study of power …
Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits
In nanoscale CMOS circuits the random dopant fluctuations (RDF) cause significant
threshold voltage (Vt) variations in transistors. In this paper, we propose a semi-analytical …
threshold voltage (Vt) variations in transistors. In this paper, we propose a semi-analytical …
9-T SRAM cell for reliable ultralow-power applications and solving multibit soft-error issue
Higher noise tolerance, lower power consumption, and higher reliability are the major
design metrics for designing an SRAM cell. It is difficult to achieve an SRAM cell with stable …
design metrics for designing an SRAM cell. It is difficult to achieve an SRAM cell with stable …
The energy/frequency convexity rule: Modeling and experimental validation on mobile devices
This paper provides both theoretical and experimental evidence for the existence of an
Energy/Frequency Convexity Rule, which relates energy consumption and CPU frequency …
Energy/Frequency Convexity Rule, which relates energy consumption and CPU frequency …
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in modern processor designs in addition
to traditional constraints on frequency. Since leakage current exhibits a strong inverse …
to traditional constraints on frequency. Since leakage current exhibits a strong inverse …
Challenges in cooling design of CPU packages for high-performance servers
J Wei - Heat transfer engineering, 2008 - Taylor & Francis
Cooling technologies that address high-density and asymmetric heat dissipation in CPU
packages of high-performance servers are discussed. Thermal management schemes and …
packages of high-performance servers are discussed. Thermal management schemes and …