Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS

S Mukhopadhyay, H Mahmoodi… - IEEE transactions on …, 2005 - ieeexplore.ieee.org
In this paper, we have analyzed and modeled failure probabilities (access-time failure,
read/write failure, and hold failure) of synchronous random-access memory (SRAM) cells …

[LIBRO][B] Statistical analysis and optimization for VLSI: Timing and power

A Srivastava, D Sylvester, D Blaauw - 2006 - books.google.com
Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book
on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest …

Benefits and costs of power-gating technique

H Jiang, M Marek-Sadowska… - … conference on computer …, 2005 - ieeexplore.ieee.org
Power-gating is a technique for saving leakage power by shutting off the idle blocks.
However, without good understanding and careful design, negative effects of power gating …

Hot spot cooling using embedded thermoelectric coolers

GJ Snyder, M Soto, R Alley, D Koester… - … -Second Annual IEEE …, 2006 - ieeexplore.ieee.org
Localized areas of high heat flux on microprocessors produce hot spots that limit their
reliability and performance. With increasingly dense circuits and the integration of high …

[LIBRO][B] Low-power electronics design

C Piguet - 2018 - books.google.com
The power consumption of integrated circuits is one of the most problematic considerations
affecting the design of high-performance chips and portable devices. The study of power …

Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits

H Mahmoodi, S Mukhopadhyay… - IEEE Journal of Solid …, 2005 - ieeexplore.ieee.org
In nanoscale CMOS circuits the random dopant fluctuations (RDF) cause significant
threshold voltage (Vt) variations in transistors. In this paper, we propose a semi-analytical …

9-T SRAM cell for reliable ultralow-power applications and solving multibit soft-error issue

S Pal, A Islam - IEEE Transactions on Device and Materials …, 2016 - ieeexplore.ieee.org
Higher noise tolerance, lower power consumption, and higher reliability are the major
design metrics for designing an SRAM cell. It is difficult to achieve an SRAM cell with stable …

The energy/frequency convexity rule: Modeling and experimental validation on mobile devices

K De Vogeleer, G Memmi, P Jouvelot… - Parallel Processing and …, 2014 - Springer
This paper provides both theoretical and experimental evidence for the existence of an
Energy/Frequency Convexity Rule, which relates energy consumption and CPU frequency …

Parametric yield estimation considering leakage variability

RR Rao, A Devgan, D Blaauw, D Sylvester - Proceedings of the 41st …, 2004 - dl.acm.org
Leakage current has become a stringent constraint in modern processor designs in addition
to traditional constraints on frequency. Since leakage current exhibits a strong inverse …

Challenges in cooling design of CPU packages for high-performance servers

J Wei - Heat transfer engineering, 2008 - Taylor & Francis
Cooling technologies that address high-density and asymmetric heat dissipation in CPU
packages of high-performance servers are discussed. Thermal management schemes and …