Electron-beam induced synthesis of nanostructures: a review
IG Gonzalez-Martinez, A Bachmatiuk, V Bezugly… - Nanoscale, 2016 - pubs.rsc.org
As the success of nanostructures grows in modern society so does the importance of our
ability to control their synthesis in precise manners, often with atomic precision as this can …
ability to control their synthesis in precise manners, often with atomic precision as this can …
Electron‐beam‐induced crystallization of isolated amorphous regions in Si, Ge, GaP, and GaAs
An energetic electron beam has been used to stimulate crystallization of spatially isolated
amorphous regions in Si, Ge, GaP, and GaAs at 30 and 300 K. In the four materials it was …
amorphous regions in Si, Ge, GaP, and GaAs at 30 and 300 K. In the four materials it was …
Electron-irradiation-induced nucleation and growth in amorphous LaPO4, ScPO4, and zircon
A Meldrum, LA Boatner, RC Ewing - Journal of materials research, 1997 - cambridge.org
Synthetic LaPO4, ScPO4, and crystalline natural zircon (ZrSiO4) from Mud Tanks, Australia
were irradiated by 1.5 MeV Kr+ ions until complete amorphization occurred as indicated by …
were irradiated by 1.5 MeV Kr+ ions until complete amorphization occurred as indicated by …
Electron-irradiation-induced phase segregation in crystalline and amorphous apatite: A TEM study
A Meldrum, LM Wang, RC Ewing - American Mineralogist, 1997 - degruyter.com
Single crystals of natural F-rich apatite and 800 keV Kr2+ ion-beam-amorphized apatite
were irradiated by an electron beam in a transmission electron microscope over a range of …
were irradiated by an electron beam in a transmission electron microscope over a range of …
Regrowth of amorphous regions in semiconductors by sub-threshold electron beams
IM Robertson, I Jenčič - Journal of nuclear materials, 1996 - Elsevier
Spatially isolated amorphous zones produced in Si, Ge and Gal'by low energy, low dose ion
implantations can be regrown at room temperature by using an electron beam to stimulate …
implantations can be regrown at room temperature by using an electron beam to stimulate …
Low energy electron-beam-induced recrystallization of continuous GaAs amorphous foils
X Yang, R Wang, H Yan, Z Zhang - Materials Science and Engineering: B, 1997 - Elsevier
Continuous amorphous foils produced in compound semiconductor GaAs by implantation of
100 keV Ar+ ions have been recrystallized under electron beam irradiation in a transmission …
100 keV Ar+ ions have been recrystallized under electron beam irradiation in a transmission …
TEM study of electron beam-induced crystallization of amorphous GeSi films
ZW Xu, AHW Ngan - Philosophical magazine letters, 2004 - Taylor & Francis
Electron beam-induced crystallization of GeSi amorphous films with two different
compositions, Ge0. 7Si0. 3 and Ge0. 1Si0. 9, has been studied. The phase changes were …
compositions, Ge0. 7Si0. 3 and Ge0. 1Si0. 9, has been studied. The phase changes were …
Ion beam induced amorphous–crystalline phase transition in Si: Quantitative approach
A point defect diffusion model for ion beam induced crystallization and amorphization at the
amorphous/crystalline interface in Si is presented and shown to be successful in providing a …
amorphous/crystalline interface in Si is presented and shown to be successful in providing a …
Electron beam induced regrowth of ion implantation damage in Si and Ge
I Jenčič, IM Robertson, J Skvarč - … Methods in Physics Research Section B …, 1999 - Elsevier
Si and Ge samples of different crystal orientations were implanted at room temperature with
Xe+ ions to a dose around 1011cm− 2; this low dose produces spatially isolated amorphous …
Xe+ ions to a dose around 1011cm− 2; this low dose produces spatially isolated amorphous …
In situ observation of electron-beam-induced ripening of Ge clusters in thin SiO2 layers
M Klimenkov, W Matz, J Borany - … and Methods in Physics Research Section …, 2000 - Elsevier
The formation and ripening of Ge nanoclusters in a thin SiO2 layer under electron irradiation
in the transmission electron microscope was studied. Cross-sectional samples of a 20 nm …
in the transmission electron microscope was studied. Cross-sectional samples of a 20 nm …