GaN FinFETs and trigate devices for power and RF applications: Review and perspective

Y Zhang, A Zubair, Z Liu, M **ao… - Semiconductor …, 2021 - iopscience.iop.org
Gallium nitride (GaN) is becoming a mainstream semiconductor for power and radio-
frequency (RF) applications. While commercial GaN devices are increasingly being adopted …

A review on the artificial neural network applications for small‐signal modeling of microwave FETs

Z Marinković, G Crupi, A Caddemi… - … Journal of Numerical …, 2020 - Wiley Online Library
The purpose of this paper is to provide a comprehensive overview of the field‐effect
transistor (FET) small‐signal modeling using artificial neural networks (ANNs). To gain an in …

Device design guideline of 5-nm-node FinFETs and nanosheet FETs for analog/RF applications

JS Yoon, RH Baek - IEEE Access, 2020 - ieeexplore.ieee.org
Analog/RF performances of 5-nm node bulk fin-shaped field-effect transistors (FinFETs) and
nanosheet FETs (NSFETs) were investigated and compared thoroughly using fully …

[HTML][HTML] Comprehensive Review of FinFET Technology: History, Structure, Challenges, Innovations, and Emerging Sensing Applications

K Karimi, A Fardoost, M Javanmard - Micromachines, 2024 - mdpi.com
The surge in demand for 3D MOSFETs, such as FinFETs, driven by recent technological
advances, is explored in this review. FinFETs, positioned as promising alternatives to bulk …

Accurate modeling of cryogenic temperature effects in 10-nm bulk CMOS FinFETs using the BSIM-CMG model

SK Singh, S Gupta, RA Vega… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
In this letter, we have proposed modifications to the existing BSIM-CMG compact model to
enhance its ability to model the behavior of short channel bulk FinFETs (both n and p-type) …

The large world of FET small‐signal equivalent circuits

G Crupi, A Caddemi, DMMP Schreurs… - … Journal of RF and …, 2016 - Wiley Online Library
The small‐signal equivalent circuit modeling of microwave field‐effect transistors (FETs) is
an evergreen and ever flourishing research field that has to be up‐to‐date with …

[HTML][HTML] Hot carrier injection reliability in nanoscale field effect transistors: Modeling and simulation methods

Y Wang, Y Li, Y Yang, W Chen - Electronics, 2022 - mdpi.com
Hot carrier injection (HCI) can generate interface traps or oxide traps mainly by dissociating
the Si-H or Si-O bond, thus affecting device performances such as threshold voltage and …

Parasitic gate capacitance model for triple-gate FinFETs

SS Rodriguez, JC Tinoco… - … on Electron Devices, 2013 - ieeexplore.ieee.org
Triple-gate FinFETs have demonstrated to be promising candidates to push further the
performance limits of the microelectronics industry, thanks to their high immunity to short …

GaN HEMT noise modeling based on 50‐Ω noise factor

G Crupi, A Caddemi, A Raffo, G Salvo… - Microwave and …, 2015 - Wiley Online Library
The extraction of a high‐frequency ivalent circuit model plays a fundamental role for the
development of any emerging transistor technology. Indeed, an equivalent circuit can …

An artificial neural network model for electro-thermal effect affected hot carrier injection reliability in 14-nm FinFETs

Y Wang, E Li, H Duan, L Tian, W Zang… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
FinFETs have a bright future for advanced analog/RF and digital circuit design in 5G/6G
technology. As the integration density increases, the self-heating effect (SHE) becomes …