The integration density of electronic systems is limited by the reliability of the integrated
circuits. To guarantee the overall performance, the integrated circuit reliability must be …

The advance of semiconductor technology not only enables integrated circuits with higher
density and better performance but also increases their vulnerability to various aging …

Quantum confinement in 3-D device structure together with the newly employed materials
like silicon-germanium (SiGe) in advanced technologies (eg, FinFET, nanowire, nanosheets …

In this work, we investigate the impact of Si-SiO 2 interface traps on the performance of
negative capacitance transistor, which is a promising emerging technology that aims at …

To ensure the correct functionality of a chip throughout its entire lifetime, preliminary circuit
analysis with respect to aging-induced degradation is indispensable. However, state-of-the …

Machine learning (ML)-driven standard cell library characterization enables rapid, on-the-fly
generation of cell libraries, opening the door for extensive design-space exploration and …

In this work, we are the first to demonstrate how well-established EDA tool flows can be
employed to upheave Self-Heating Effects (SHE) from individual devices at the transistor …

Circuit analysis with respect to aging-induced degradation is critical to ensure correct
operation throughout the entire lifetime of a chip. However, state-of-the-art techniques only …

Due to severer transistor aging at nanoscale, circuit design margin becomes extremely tight
for advanced technology nodes. Thus, reliability-aware circuit design is urgently needed. In …

The reliable operation of ICs is subject to physical effects like electromigration, thermal and
stress migration, negative bias temperature instability, hot-carrier injection, etc. While these …