Oxide semiconductor thin‐film transistors: a review of recent advances

E Fortunato, P Barquinha, R Martins - Advanced materials, 2012 - Wiley Online Library
Transparent electronics is today one of the most advanced topics for a wide range of device
applications. The key components are wide bandgap semiconductors, where oxides of …

Metal oxide semiconductor thin-film transistors for flexible electronics

L Petti, N Münzenrieder, C Vogt, H Faber… - Applied Physics …, 2016 - pubs.aip.org
The field of flexible electronics has rapidly expanded over the last decades, pioneering
novel applications, such as wearable and textile integrated devices, seamless and …

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

A Suresh, JF Muth - Applied Physics Letters, 2008 - pubs.aip.org
The effects of bias stress on transistor performance are important when considering
nontraditional channel materials for thin film transistors. Applying a gate bias stress to …

Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors

S Lee, K Ghaffarzadeh, A Nathan, J Robertson… - Applied Physics …, 2011 - pubs.aip.org
The electron conduction mechanism in the above-threshold regime in amorphous oxide
semiconductor thin film transistors is shown to be controlled by percolation and trap-limited …

Electronic structure of oxygen-vacancy defects in amorphous In-Ga-Zn-O semiconductors

HK Noh, KJ Chang, B Ryu, WJ Lee - Physical Review B—Condensed Matter …, 2011 - APS
We perform first-principles density functional calculations to investigate the atomic and
electronic properties of various O-vacancy (VO) defects in amorphous indium gallium zinc …

High-Performance a-IGZO TFT With Gate Dielectric Fabricated at Room Temperature

JS Lee, S Chang, SM Koo… - IEEE electron device letters, 2010 - ieeexplore.ieee.org
We have investigated the high-performance oxide thin-film transistor (TFT) with an
amorphous indium gallium zinc oxide (a-IGZO) channel and ZrO_2 gate dielectrics. The a …

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

TC Fung, CS Chuang, C Chen, K Abe… - Journal of Applied …, 2009 - pubs.aip.org
We reported on a two-dimensional simulation of electrical properties of the radio frequency
(rf) sputter amorphous In–Ga–Zn–O (⁠ a-IGZO) thin-film transistors (TFTs). The a-IGZO TFT …

Conversion of an ultra-wide bandgap amorphous oxide insulator to a semiconductor

J Kim, T Sekiya, N Miyokawa, N Watanabe… - NPG Asia …, 2017 - nature.com
The variety of semiconductor materials has been extended in various directions, for
example, to very wide bandgap materials such as oxide semiconductors as well as to …

Role of Ga2O3–In2O3–ZnO channel composition on the electrical performance of thin-film transistors

A Olziersky, P Barquinha, A Vilà, C Magaña… - Materials Chemistry and …, 2011 - Elsevier
In this work we present a study aiming to determine the role of Ga2O3–In2O3–ZnO (GIZO)
channel layer composition on the electrical performance and stability exhibited by thin-film …

[BOOK][B] Handbook of zinc oxide and related materials: volume two, devices and nano-engineering

ZC Feng - 2012 - books.google.com
Volume Two focuses on devices and nanostructures created from ZnO and similar materials.
The book covers various nanostructures, synthesis/creation strategies, device behavior, and …