Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Oxide semiconductor thin‐film transistors: a review of recent advances
Transparent electronics is today one of the most advanced topics for a wide range of device
applications. The key components are wide bandgap semiconductors, where oxides of …
applications. The key components are wide bandgap semiconductors, where oxides of …
Metal oxide semiconductor thin-film transistors for flexible electronics
The field of flexible electronics has rapidly expanded over the last decades, pioneering
novel applications, such as wearable and textile integrated devices, seamless and …
novel applications, such as wearable and textile integrated devices, seamless and …
Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
A Suresh, JF Muth - Applied Physics Letters, 2008 - pubs.aip.org
The effects of bias stress on transistor performance are important when considering
nontraditional channel materials for thin film transistors. Applying a gate bias stress to …
nontraditional channel materials for thin film transistors. Applying a gate bias stress to …
Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors
The electron conduction mechanism in the above-threshold regime in amorphous oxide
semiconductor thin film transistors is shown to be controlled by percolation and trap-limited …
semiconductor thin film transistors is shown to be controlled by percolation and trap-limited …
Electronic structure of oxygen-vacancy defects in amorphous In-Ga-Zn-O semiconductors
We perform first-principles density functional calculations to investigate the atomic and
electronic properties of various O-vacancy (VO) defects in amorphous indium gallium zinc …
electronic properties of various O-vacancy (VO) defects in amorphous indium gallium zinc …
High-Performance a-IGZO TFT With Gate Dielectric Fabricated at Room Temperature
JS Lee, S Chang, SM Koo… - IEEE electron device letters, 2010 - ieeexplore.ieee.org
We have investigated the high-performance oxide thin-film transistor (TFT) with an
amorphous indium gallium zinc oxide (a-IGZO) channel and ZrO_2 gate dielectrics. The a …
amorphous indium gallium zinc oxide (a-IGZO) channel and ZrO_2 gate dielectrics. The a …
Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors
TC Fung, CS Chuang, C Chen, K Abe… - Journal of Applied …, 2009 - pubs.aip.org
We reported on a two-dimensional simulation of electrical properties of the radio frequency
(rf) sputter amorphous In–Ga–Zn–O ( a-IGZO) thin-film transistors (TFTs). The a-IGZO TFT …
(rf) sputter amorphous In–Ga–Zn–O ( a-IGZO) thin-film transistors (TFTs). The a-IGZO TFT …
Conversion of an ultra-wide bandgap amorphous oxide insulator to a semiconductor
J Kim, T Sekiya, N Miyokawa, N Watanabe… - NPG Asia …, 2017 - nature.com
The variety of semiconductor materials has been extended in various directions, for
example, to very wide bandgap materials such as oxide semiconductors as well as to …
example, to very wide bandgap materials such as oxide semiconductors as well as to …
Role of Ga2O3–In2O3–ZnO channel composition on the electrical performance of thin-film transistors
In this work we present a study aiming to determine the role of Ga2O3–In2O3–ZnO (GIZO)
channel layer composition on the electrical performance and stability exhibited by thin-film …
channel layer composition on the electrical performance and stability exhibited by thin-film …
[BOOK][B] Handbook of zinc oxide and related materials: volume two, devices and nano-engineering
ZC Feng - 2012 - books.google.com
Volume Two focuses on devices and nanostructures created from ZnO and similar materials.
The book covers various nanostructures, synthesis/creation strategies, device behavior, and …
The book covers various nanostructures, synthesis/creation strategies, device behavior, and …