The goal of natural image denoising is to estimate a clean version of a given noisy image,
utilizing prior knowledge on the statistics of natural images. The problem has been studied …

In nano-scale CMOS technologies, storage cells such as latches are becoming increasingly
sensitive to triple-node-upset (TNU) errors caused by harsh radiation effects. In the context …

In this paper we analyze the conditions making Transient Faults (TFs) affecting the nodes of
conventional latch structures generate output Soft-Errors (SEs). We investigate the …

As technology size scales down toward lower two-digit nanometer dimensions, sensitivity of
CMOS circuits to radiation effects increases. Static random access memory cells (SRAMs) …

We present heterogenous quorum-based asynchronous wake-up scheduling schemes for
wireless sensor networks. The schemes can ensure that two nodes that adopt different …

First, a new high-performance robust latch (referred to as HiPeR latch) is presented that is
insensitive to transient faults affecting its internal and output nodes by design, independently …

Deep sub-micrometer/nano CMOS circuits are more sensitive to externally induced radiation
phenomena that are likely to cause the occurrence of so-called soft errors. Therefore, the …

In this paper, we first evaluate whether or not a multiple transient fault (multiple TF)
generated by the hit of a single cosmic ray neutron can give rise to a bidirectional error at the …

The continuous decrease in CMOS technology feature size increases the susceptibility of
such circuits to single event upsets (SEU) caused by the impact of particle strikes on system …

CMOS nanometric technologies are increasingly sensitive to soft errors, including SEUs
affecting storage cells and SETs initiated in the combinational logic, and eventually captured …