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An advanced calibration method for probe leakage correction in on-wafer test systems
Y Wang, X Fu, A Wu, Y Huo, C Liu… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
This article presents an advanced calibration method for solving the error terms due to probe-
probe leakage in an on-wafer test system. A new 12-term error model for the on-wafer test …
probe leakage in an on-wafer test system. A new 12-term error model for the on-wafer test …
Optimal series resistors for on-wafer calibrations
The series resistor (SR) is a common on-wafer device typically used in the series-resistor
(SR) calibration and for estimating the capacitance per unit length of coplanar waveguide …
(SR) calibration and for estimating the capacitance per unit length of coplanar waveguide …
[PDF][PDF] 在片校准件参数定值方法
霍晔, 吴爱华, 王一帮, 栾鹏, 刘晨, 梁法国, 孙静… - 计量学报, 2022 - jlxb.china-csm.org
为解决在片校准件长时间使用后, 由于参数定值发生偏差, 导致测试结果不准的问题,
针对在片校准件的等效电路模型, 提出了一种参数定值方法. 通过测试在片校准件S 参数 …
针对在片校准件的等效电路模型, 提出了一种参数定值方法. 通过测试在片校准件S 参数 …
A unified approach for reformulations of LRM/LRMM/LRRM calibration algorithms based on the T-matrix representation
This paper investigates a unified theory to derive vector network analyzer calibration
algorithms based on the T-matrix representation, by which means the line-reflect-match …
algorithms based on the T-matrix representation, by which means the line-reflect-match …
An Improved LRRM Calibration Algorithm Combined with Thru-Line De-embedding Method
Y Zhang, B **a, J Chen, J Mao - 2022 International Conference …, 2022 - ieeexplore.ieee.org
In this paper, an improved LINE-REFLECT-REFLECT-MATCH (LRRM) calibration algorithm
combined with Thru-Line de-embedding method (Thru Line-LRRM) is proposed. The …
combined with Thru-Line de-embedding method (Thru Line-LRRM) is proposed. The …
[PDF][PDF] 无源器件在片散射参数校准比较方法研究
霍晔, 吴爱华, 王一帮, 栾鹏, 刘晨, 梁法国, 孙静… - 计量学报, 2022 - jlxb.china-csm.org
为解决由于不同校准方法导致无源器件在片散射参数测试结果存在偏差的问题,
通过以校准准确度高的多线TRL 校准方法为参考基准, 比较SOLT, LRRM …
通过以校准准确度高的多线TRL 校准方法为参考基准, 比较SOLT, LRRM …
Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band
Y Wang, X Fu, A Wu, C Liu, P Luan, F Liang… - International Journal of …, 2020 - cambridge.org
We present details of on-wafer-level 16-term error model calibration kits used for the
characterization of W-band circuits based on a grounded coplanar waveguide (GCPW) …
characterization of W-band circuits based on a grounded coplanar waveguide (GCPW) …
ИСПОЛЬЗОВАНИЕ САПР PATHWAVE DESIGN ДЛЯ ОТЛАДКИ LRRM-КАЛИБРОВКИ
ВВ СЕРДЮКОВ, АВ БОЛЬШОВ, ВН УЛЬЯНОВ - ТЕХНОЛОГИИ И МЕТОДИКИ … - elibrary.ru
Использование САПР PathWave Design для отладки <i>LRRM</i>-калибровки
КОРЗИНА ПОИСК НАВИГАТОР СЕССИЯ КОНТАКТЫ ИНФОРМАЦИЯ О ПУБЛИКАЦИИ …
КОРЗИНА ПОИСК НАВИГАТОР СЕССИЯ КОНТАКТЫ ИНФОРМАЦИЯ О ПУБЛИКАЦИИ …
[KNJIGA][B] High-Frequency Circuits for Environments Affected by Radiation
JE Hibbert - 2019 - search.proquest.com
The reluctance of previous governments to make adequate provision for the long-term
storage and disposal of nuclear waste has resulted in an imminent and significant …
storage and disposal of nuclear waste has resulted in an imminent and significant …
STUDY ON DE-EMBEDDING APPROACH OF NON-COAXIAL MICROWAVE DEVICE TEST FIXTURES
S Chen, Z Wang, P Yang, X Yan… - 2018 19th International …, 2018 - ieeexplore.ieee.org
With the development of mobile communication technologies, the application of 5G key
technologies such as large-scale antennas, full-spectrum access, and high-frequency …
technologies such as large-scale antennas, full-spectrum access, and high-frequency …