This review introduces hydrogen depth profiling by nuclear reaction analysis (NRA) via the
resonant 1 H (15 N, αγ) 12 C reaction as a versatile method for the highly depth-resolved …

Abstract Following the IAEA Technical Meeting on'Advanced Methodologies for the Analysis
of Materials in Energy Applications Using Ion Beam Accelerators', this paper reviews the …

This report describes the use of the program SIMNRA and the physical concepts
implemented therein. SIMNRA is a Microsoft Windows 95/Windows NT program for the …

SIMNRA is an analytical code for the simulation of ion beam analysis energy spectra
obtained by Rutherford backscattering, non-Rutherford scattering, elastic recoil detection …

A new version of the SigmaCalc Internet site (http://sigmacalc. iate. obninsk. ru) intended to
provide evaluated differential cross-sections for spectra simulation is presented. Results of …

The suite of techniques which are available with the small accelerators used for MeV ion
beam analysis (IBA) range from broad beams, microbeams or external beams using the …

Ion beam analysis (IBA) is a cluster of techniques including Rutherford and non-Rutherford
backscattering spectrometry and particle-induced X-ray emission (PIXE). Recently, the …

The analysis of thin films is of central importance for functional materials, including the very
large and active field of nanomaterials. Quantitative elemental depth profiling is basic to …

This paper presents the underlying physics and statistical models that are used in the newly
developed program NRADC for fully automated deconvolution of trace level impurity depth …

Abstract Ion Beam Analysis (IBA) utilizing MeV ion beams provides valuable insights into
surface elemental composition across the entire periodic table. While ion beam …