Semiconductor-metal interface influence on the bulk low-frequency noise behavior and role of the phonons refraction points
HV Asriyan, AA Shatveryan… - … and Information in …, 2005 - spiedigitallibrary.org
The influence of the surface and interfaces of semiconductor-metal Al/n+ Si-nSi/Al and Ag/n+
Si-nSi/Ag structures with different aluminum and silver contact coating layers on the level …
Si-nSi/Ag structures with different aluminum and silver contact coating layers on the level …
Low-frequency noise in non-homogeneously doped semiconductor
HV Asriyan, FV Gasparyan, VM Aroutiounian… - Sensors and Actuators A …, 2004 - Elsevier
The possibility of usage of theoretically predicted additional 1/f noise component,
conditioned by presence of the built-in electric field, for the reliability estimation of …
conditioned by presence of the built-in electric field, for the reliability estimation of …
[BOOK][B] Methods and materials for remote sensing: infrared photo-detectors, radiometers and arrays
Y Abrahamian, R Martirossyan - 2004 - books.google.com
" Methods and Materials for Remote Sensing: InfraredPhoto-Detectors,"" Radiometers and
Arrays" presents the basicprinciples and the guidelines for the design of IR and …
Arrays" presents the basicprinciples and the guidelines for the design of IR and …
[HTML][HTML] Internal Electrical Noises of BioFET Sensors Based on Various Architectures
L Gasparyan, F Gasparyan, V Simonyan - Open Journal of Biophysics, 2021 - scirp.org
The results of a comparative literature analysis of internal electrical noises and signal-to-
noise ratio for nanoscale BioFET (biological field-effect transistor) and DNA …
noise ratio for nanoscale BioFET (biological field-effect transistor) and DNA …
1/f Noise component conditioned by built-in electric field in semiconductors
HV Asriyan, FV Gasparyan - Modern Physics Letters B, 2004 - World Scientific
The influence of the built-in electric field on the low-frequency current fluctuations in n-type
non-degenerate homogeneous semiconductors at presence of constant external electric …
non-degenerate homogeneous semiconductors at presence of constant external electric …
Electrophysical and photoelectrical properties of UV-range injection structures made of silicon carbide
HV Asriyan, FV Gasparyan, VM Aroutiounian… - Applied surface …, 2001 - Elsevier
The current–voltage characteristics (CVCs), photosensitivity, diffusion, generation–
recombination, low frequency noises and detectivity of the visible range 6H–SiC p+ nn+ …
recombination, low frequency noises and detectivity of the visible range 6H–SiC p+ nn+ …
Internal Noises in MOS/EIS, MOSFET/ISFET Structures and Light Addressable Potentiometric Sensors
F Gasparyan, V Aroutiounian - Sensors & Transducers, 2012 - search.proquest.com
The main types of internal noises in (bio-) chemical sensors on the base of electrolyte-
insulator-semiconductor structures, ion selective field-effect transistors and light addressable …
insulator-semiconductor structures, ion selective field-effect transistors and light addressable …
Built-in electric field as an additional source of 1/f noise in semiconductors
HV Asriyan, FV Gasparyan… - Noise and Information …, 2003 - spiedigitallibrary.org
The influence of the built-in electric field (eg several potential barriers, impurity gradients,
etc) at presence of external crossed electric and magnetic fields on the level of low …
etc) at presence of external crossed electric and magnetic fields on the level of low …
[PDF][PDF] МЕХАНИЗМ МЕДЛЕННОЙ РЕЛАКСАЦИИ РАВНОВЕСНЫХ ФЛУКТУАЦИЙ ФУРМНЯИ РАСПРЕДЕЛЕНИЯ ЭЛЕКТРОНОВ В НЕВЫРОЖДЕННЫХ …
СВ Мелконян - ՀՀ ԳԱԱ Տեղեկագիր. Ֆիզիկա, 2001 - 93.187.165.86
Одной их важнейших задач в теории полупроводников является проблема физического
происхождения 1//-флуктуации тока (или напря жения). Результаты обширных …
происхождения 1//-флуктуации тока (или напря жения). Результаты обширных …