Learning control for motion coordination in wafer scanners: toward gain adaptation

F Song, Y Liu, D Shen, L Li, J Tan - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Accurate pattern transfer in wafer scanners necessitates the wafer stage and the reticle
stage executing a coordinated motion with the synchronization error in terms of nanometers …

Advanced motion control for precision mechatronics: Control, identification, and learning of complex systems

T Oomen - IEEJ Journal of Industry Applications, 2018 - jstage.jst.go.jp
Manufacturing equipment and scientific instruments, including wafer scanners, printers,
microscopes, and medical imaging scanners, require accurate and fast motions. An increase …

Motion control of wafer scanners in lithography systems: From setpoint generation to multi-stage coordination

F Song, Y Liu, Y Dong, X Chen… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Accurate pattern transfer, coupled with stringent requirements for throughput and quality in
lithography systems, necessitates the wafer scanner to execute an aggressive motion with …

Motion control, mechatronics design, and Moore's law

M Steinbuch, T Oomen, H Vermeulen - IEEJ Journal of Industry …, 2022 - jstage.jst.go.jp
Technology in a broad sense is driven by developments in semiconductor technology,
particularly with respect to the computational power of devices and systems, as well as …

Intelligent GRU-RIC position-loop feedforward compensation control method with application to an ultraprecision motion stage

R Zhou, C Hu, T Ou, Z Wang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
In the realm of ultraprecision motion control, achieving high tracking accuracy, great
trajectory generalization, and robust disturbance rejection simultaneously remains a …

Data-driven feedforward learning with force ripple compensation for wafer stages: A variable-gain robust approach

F Song, Y Liu, W **, J Tan, W He - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
To meet the increasing demand for denser integrated circuits, feedforward control plays an
important role in the achievement of high servo performance of wafer stages. The …

Kernel-based identification of non-causal systems with application to inverse model control

L Blanken, T Oomen - Automatica, 2020 - Elsevier
Abstract Models of inverse systems are commonly encountered in control, eg, feedforward.
The aim of this paper is to address several aspects in identification of inverse models …

[HTML][HTML] Physics-guided neural networks for feedforward control with input-to-state-stability guarantees

M Bolderman, H Butler, S Koekebakker… - Control Engineering …, 2024 - Elsevier
The increasing demand on precision and throughput within high-precision mechatronics
industries requires a new generation of feedforward controllers with higher accuracy than …

Iterative learning control for video-rate atomic force microscopy

N Nikooienejad, M Maroufi… - … /ASME Transactions on …, 2020 - ieeexplore.ieee.org
We present a control scheme for video-rate atomic force microscopy with rosette pattern. The
controller structure involves a feedback internal-model-based controller and a feedforward …

Physics–guided neural networks for inversion–based feedforward control applied to linear motors

M Bolderman, M Lazar, H Butler - 2021 IEEE Conference on …, 2021 - ieeexplore.ieee.org
Ever–increasing throughput specifications in semiconductor manufacturing require
operating high–precision mechatronics, such as linear motors, at higher accelerations. In …