A systematic review of compressive sensing: Concepts, implementations and applications

M Rani, SB Dhok, RB Deshmukh - IEEE access, 2018 - ieeexplore.ieee.org
Compressive Sensing (CS) is a new sensing modality, which compresses the signal being
acquired at the time of sensing. Signals can have sparse or compressible representation …

Applications of artificial intelligence on the modeling and optimization for analog and mixed-signal circuits: A review

M Fayazi, Z Colter, E Afshari… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Recently, there have been many studies attempting to take advantage of advancements in
Artificial Intelligence (AI) in Analog and Mixed-Signal (AMS) circuit design. Automated circuit …

Hardware Trojan attacks: Threat analysis and countermeasures

S Bhunia, MS Hsiao, M Banga… - Proceedings of the …, 2014 - ieeexplore.ieee.org
Security of a computer system has been traditionally related to the security of the software or
the information being processed. The underlying hardware used for information processing …

Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos

Z Zhang, TA El-Moselhy, IM Elfadel… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Uncertainties have become a major concern in integrated circuit design. In order to avoid the
huge number of repeated simulations in conventional Monte Carlo flows, this paper presents …

Underdesigned and opportunistic computing in presence of hardware variability

P Gupta, Y Agarwal, L Dolecek, N Dutt… - … on Computer-Aided …, 2012 - ieeexplore.ieee.org
Microelectronic circuits exhibit increasing variations in performance, power consumption,
and reliability parameters across the manufactured parts and across use of these parts over …

Machine learning applications in IC testing

HG Stratigopoulos - … IEEE 23rd European Test Symposium (ETS …, 2018 - ieeexplore.ieee.org
In recent years, a large number of works have surfaced demonstrating applications of
machine learning in the field of integrated circuit testing. Many of these works showcase the …

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data

F Wang, W Zhang, S Sun, X Li, C Gu - Proceedings of the 50th Annual …, 2013 - dl.acm.org
Efficient high-dimensional performance modeling of today's complex analog and mixed-
signal (AMS) circuits with large-scale process variations is an important yet challenging task …

Experience of data analytics in EDA and test—principles, promises, and challenges

LC Wang - IEEE Transactions on Computer-Aided Design of …, 2016 - ieeexplore.ieee.org
Applying modern data mining in electronic design automation and test has become an area
of growing interest in recent years. This paper reviews some of the recent developments in …

Review on compressive sensing algorithms for ECG signal for IoT based deep learning framework

SS Kumar, P Ramachandran - Applied Sciences, 2022 - mdpi.com
Nowadays, healthcare is becoming very modern, and the support of Internet of Things (IoT)
is inevitable in a personal healthcare system. A typical personal healthcare system acquires …

WDP-BNN: Efficient wafer defect pattern classification via binarized neural network

Q Zhang, Y Zhang, J Li, Y Li - Integration, 2022 - Elsevier
Wafer map defect pattern classification using convolutional neural network (CNN) has
gained a lot of attention in recent years but it demands huge computation and memory cost …