GPUs are used in high-reliability systems, including high-performance computers and
autonomous vehicles. Because GPUs employ a high-bandwidth, wide-interface to DRAM …

This paper presents a method to protect memories against multiple bit upsets and to improve
manufacturing yield. The proposed method, called a Matrix code, combines Hamming and …

Radiation particles can impact registers or memories creating soft errors. These errors can
modify more than one bit causing a multiple cell upset (MCU) which consists of errors in …

The reliability concern associated with radiation-induced soft errors in embedded memories
increases as semiconductor technology scales deep into the sub-40-nm regime. As the …

Soft error originating from cosmic ray is a serious concern for reliability demanding
applications, such as autonomous driving, supercomputer, and public transportation system …

Static random access memories (SRAMs) are key in electronic systems. They are used not
only as standalone devices, but also embedded in application specific integrated circuits …

DRAM vendors utilize On-Die Error Correction Codes (OD-ECC) to correct random bit errors
internally. Meanwhile, system companies utilize Rank-Level ECC (RL-ECC) to protect data …

This paper describes architectural enhancements in the Altera Stratix-V" FPGA architecture,
built on a 28nm TSMC process, together with the data supporting those choices. Among the …

The use of error-correction codes (ECCs) with advanced correction capability is a common
system-level strategy to harden the memory against multiple bit upsets (MBUs). Therefore …

As technology scaling increases embedded static random access memory bit-cell density,
the number of soft errors due to radiation-induced multiple-bit upsets (MBUs) also increases …