The integration density of state-of-the-art electronic systems is limited by the reliability of the
manufactured integrated circuits at a desired circuit density. Design rules, operating …

Integrated circuit design in the late CMOS era is challenged by the ever-increasing
variability and reliability issues. The situation is further compounded by real-time …

In this paper, an integrated variability and reliability analysis method based on surrogate
models is introduced. The surrogate models here are response surfaces that describe a …

With the evolving technological development of integrated circuits, ensuring electromagnetic
compatibility (EMC) is becoming a serious challenge for electronic circuit and system …

A method to evaluate the reliability of the Integrated Circuit without knowing the details of the
internal circuit is developed. This method is called Pseudo Black Box testing because the …

Based on some new accelerated lifetime models and failure equivalent circuit modeling
techniques for the common semiconductor wear out mechanisms, simulation program with …

Aggressive scaling to nanometer CMOS technologies causes both analog and digital circuit
parameters to degrade over time due to die-level stress effects (ie NBTI, HCI, TDDB, etc). In …

Transient pulses generated by high-energy particles can cause soft errors in circuits,
resulting in spacecraft malfunctions and posing serious threats to the normal operation of …

A framework is proposed to analyze circuit layout geometries to predict chip lifetime due to
low-k time-dependent dielectric breakdown (TDDB). The methodology uses as inputs data …

This article proposes an aging reliability compact model with high accuracy to simulate trap
effects after long-term aging in power Gallium Nitride (GaN) based high electron mobility …