Directed test generation for hardware validation: A survey

A Jayasena, P Mishra - ACM Computing Surveys, 2024 - dl.acm.org
The complexity of hardware designs has increased over the years due to the rapid
advancement of technology coupled with the need to support diverse and complex features …

Unsupervised learning for combinatorial optimization with principled objective relaxation

HP Wang, N Wu, H Yang, C Hao… - Advances in Neural …, 2022 - proceedings.neurips.cc
Using machine learning to solve combinatorial optimization (CO) problems is challenging,
especially when the data is unlabeled. This work proposes an unsupervised learning …

AI/ML algorithms and applications in VLSI design and technology

D Amuru, A Zahra, HV Vudumula, PK Cherupally… - Integration, 2023 - Elsevier
An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

Towards develo** high performance RISC-V processors using agile methodology

Y Xu, Z Yu, D Tang, G Chen, L Chen… - 2022 55th IEEE/ACM …, 2022 - ieeexplore.ieee.org
While research has shown that the agile chip design methodology is promising to sustain
the scaling of computing performance in a more efficient way, it is still of limited usage in …

The dawn of ai-native eda: Promises and challenges of large circuit models

L Chen, Y Chen, Z Chu, W Fang, TY Ho… - arxiv preprint arxiv …, 2024 - arxiv.org
Within the Electronic Design Automation (EDA) domain, AI-driven solutions have emerged
as formidable tools, yet they typically augment rather than redefine existing methodologies …

Survey of machine learning for software-assisted hardware design verification: Past, present, and prospect

N Wu, Y Li, H Yang, H Chen, S Dai, C Hao… - ACM Transactions on …, 2024 - dl.acm.org
With the ever-increasing hardware design complexity comes the realization that efforts
required for hardware verification increase at an even faster rate. Driven by the push from …

Late breaking results: Test selection for RTL coverage by unsupervised learning from fast functional simulation

R Liang, N Pinckney, Y Chai, H Ren… - 2023 60th ACM/IEEE …, 2023 - ieeexplore.ieee.org
Functional coverage closure is an important but RTL simulation intensive aspect of
constrained random verification. To reduce these computational demands, we propose test …

Large circuit models: opportunities and challenges

L Chen, Y Chen, Z Chu, W Fang, TY Ho… - Science China …, 2024 - Springer
Within the electronic design automation (EDA) domain, artificial intelligence (AI)-driven
solutions have emerged as formidable tools, yet they typically augment rather than redefine …

Lfps: Learned formal proof strengthening for efficient hardware verification

M Kang, A Nova, E Singh, GS Bathini… - 2023 IEEE/ACM …, 2023 - ieeexplore.ieee.org
Proof decomposition via assume-guarantee with helper properties, ie helpers, is one of the
most promising approaches to address the complexity of hardware formal verification (FV) …

Learning to walk over relational graphs of source code

P Pashakhanloo, A Naik, H Dai… - Deep Learning for …, 2022 - openreview.net
Information-rich relational graphs have shown great potential in designing effective
representations of code for program-understanding tasks. However, the wealth of structural …