Radiation damage in GaN/AlGaN and SiC electronic and photonic devices

SJ Pearton, X **a, F Ren, MAJ Rasel… - Journal of Vacuum …, 2023 - pubs.aip.org
The wide bandgap semiconductors SiC and GaN are commercialized for power electronics
and for visible to UV light-emitting diodes in the case of the GaN/InGaN/AlGaN materials …

Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technologies

C Martinella, RG Alía, R Stark… - … on Nuclear Science, 2021 - ieeexplore.ieee.org
Accelerated terrestrial neutron irradiations were performed on different commercial SiC
power MOSFETs with planar, trench, and double-trench architectures. The results were used …

Radiation damage in the ultra-wide bandgap semiconductor Ga2O3

X **a, JS Li, R Sharma, F Ren, MAJ Rasel… - ECS Journal of Solid …, 2022 - iopscience.iop.org
We present a review of the published experimental and simulation radiation damage results
in Ga 2 O 3. All of the polytypes of Ga 2 O 3 are expected to show similar radiation …

Unravelling the secrets of the resistance of GaN to strongly ionising radiation

MC Sequeira, JG Mattei, H Vazquez… - Communications …, 2021 - nature.com
GaN is the most promising upgrade to the traditional Si-based radiation-hard technologies.
However, the underlying mechanisms driving its resistance are unclear, especially for …

Heavy-ion microbeam studies of single-event leakage current mechanism in SiC VD-MOSFETs

C Martinella, T Ziemann, R Stark… - … on Nuclear Science, 2020 - ieeexplore.ieee.org
Heavy-ion microbeams are employed for probing the radiation-sensitive regions in
commercial silicon carbide (SiC) vertical double-diffused power (VD)-MOSFETs with …

Is SiC a predominant technology for future high power electronics?: a critical review

ASA Fletcher, D Nirmal, J Ajayan… - Current …, 2025 - benthamdirect.com
Due to the magnificent properties of Silicon Carbide (SiC), such as high saturation drift
velocity, large operating temperature, higher cut-off and maximum frequency (fT and fmax) …

Opportunities in single event effects in radiation-exposed SiC and GaN power electronics

SJ Pearton, A Haque, A Khachatrian… - ECS Journal of Solid …, 2021 - iopscience.iop.org
Radiation effects have a critical impact on the reliability of SiC and GaN power electronics
and must be understood for space and avionics applications involving exposure to various …

Impact of heavy-ion range on single-event effects in silicon carbide power junction barrier Schottky diodes

A Sengupta, DR Ball, AF Witulski… - … on Nuclear Science, 2023 - ieeexplore.ieee.org
Experimental heavy-ion responses of silicon carbide (SiC) junction barrier Schottky (JBS)
diodes are presented. Measured data indicate that heavy ions having range less than the …

Impacts of defects on the mechanical and thermal properties of SiC and GeC monolayers

K Ren, L Huang, H Shu, G Zhang, W Mu… - Physical Chemistry …, 2023 - pubs.rsc.org
Defect engineering has been considered as an effective way for controlling the heat
transport properties of two-dimensional materials. In this work, the effects of point vacancies …

A Genetic Algorithm Trained Machine-Learned Interatomic Potential for the Silicon–Carbon System

M MacIsaac, S Bavdekar, D Spearot… - The Journal of Physical …, 2024 - ACS Publications
A linear regression-based machine learned interatomic potential (MLIP) was developed for
the silicon–carbon system. The MLIP was predominantly trained on structures discovered …