FinFET based SRAMs in Sub-10nm domain

MU Mohammed, A Nizam, L Ali, MH Chowdhury - Microelectronics Journal, 2021 - Elsevier
An exponential rise in transistor count, have increased the power consumption of the
modern digital system. Moreover, at lower technology node, the performance of …

One-sided schmitt-trigger-based 9T SRAM cell for near-threshold operation

K Cho, J Park, TW Oh, SO Jung - IEEE Transactions on Circuits …, 2020 - ieeexplore.ieee.org
This paper presents a one-sided Schmitt-trigger-based 9T static random access memory cell
with low energy consumption and high read stability, write ability, and hold stability yields in …

[BOOK][B] Robust SRAM designs and analysis

J Singh, SP Mohanty, DK Pradhan - 2012 - books.google.com
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and
analysis to meet the nano-regime challenges for CMOS devices and emerging devices …

A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)

A Teman, L Pergament, O Cohen… - IEEE Journal of Solid …, 2011 - ieeexplore.ieee.org
Low voltage operation of digital circuits continues to be an attractive option for aggressive
power reduction. As standard SRAM bitcells are limited to operation in the strong-inversion …

Illumination normalization with time-dependent intrinsic images for video surveillance

Y Matsushita, K Nishino, K Ikeuchi… - IEEE Transactions on …, 2004 - ieeexplore.ieee.org
Variation in illumination conditions caused by weather, time of day, etc., makes the task
difficult when building video surveillance systems of real world scenes. Especially, cast …

Comparative analysis of memristor models and memories design

J Singh, B Raj - Journal of Semiconductors, 2018 - iopscience.iop.org
The advent of the memristor breaks the scaling limitations of MOS technology and prevails
over emerging semiconductor devices. In this paper, various memristor models including …

Design of soft-error resilient SRAM cell with high read and write stability for robust operations

S Kumar, A Mukherjee - AEU-International Journal of Electronics and …, 2023 - Elsevier
This paper proposes a highly robust 16 transistor soft-error resilient SRAM cell (SERSC-
16T) to provide complete resilience to single event upsets (SEU). The proposed cell is …

Single-event multiple effect tolerant RHBD14T SRAM cell design for space applications

NR Ch, B Gupta, G Kaushal - IEEE Transactions on Device and …, 2021 - ieeexplore.ieee.org
Static Random Access Memory (SRAM) is primarily used as a memory storage element,
which is susceptible to radiation-induced Single Event Upsets (SEUs). Hence, a robust …

A 32-nm subthreshold 7T SRAM bit cell with read assist

S Gupta, K Gupta, N Pandey - IEEE Transactions on Very Large …, 2017 - ieeexplore.ieee.org
The implementation of the six-transistor (6T) static random access memory cell in deep
submicrometer region has become difficult due to the compromise between area, power …

Design of high-reliability memory cell to mitigate single event multiple node upsets

H Li, L **ao, C Qi, J Li - … Transactions on Circuits and Systems I …, 2021 - ieeexplore.ieee.org
As technology scaling down, the sensitivity of SRAM cells to radiation-induced Single Event
Upsets (SEUs) increases, and Single Event Multiple Node Upsets (SEMNUs) due to charge …