FinFET based SRAMs in Sub-10nm domain
An exponential rise in transistor count, have increased the power consumption of the
modern digital system. Moreover, at lower technology node, the performance of …
modern digital system. Moreover, at lower technology node, the performance of …
One-sided schmitt-trigger-based 9T SRAM cell for near-threshold operation
This paper presents a one-sided Schmitt-trigger-based 9T static random access memory cell
with low energy consumption and high read stability, write ability, and hold stability yields in …
with low energy consumption and high read stability, write ability, and hold stability yields in …
[BOOK][B] Robust SRAM designs and analysis
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and
analysis to meet the nano-regime challenges for CMOS devices and emerging devices …
analysis to meet the nano-regime challenges for CMOS devices and emerging devices …
A 250 mV 8 kb 40 nm ultra-low power 9T supply feedback SRAM (SF-SRAM)
A Teman, L Pergament, O Cohen… - IEEE Journal of Solid …, 2011 - ieeexplore.ieee.org
Low voltage operation of digital circuits continues to be an attractive option for aggressive
power reduction. As standard SRAM bitcells are limited to operation in the strong-inversion …
power reduction. As standard SRAM bitcells are limited to operation in the strong-inversion …
Illumination normalization with time-dependent intrinsic images for video surveillance
Variation in illumination conditions caused by weather, time of day, etc., makes the task
difficult when building video surveillance systems of real world scenes. Especially, cast …
difficult when building video surveillance systems of real world scenes. Especially, cast …
Comparative analysis of memristor models and memories design
The advent of the memristor breaks the scaling limitations of MOS technology and prevails
over emerging semiconductor devices. In this paper, various memristor models including …
over emerging semiconductor devices. In this paper, various memristor models including …
Design of soft-error resilient SRAM cell with high read and write stability for robust operations
This paper proposes a highly robust 16 transistor soft-error resilient SRAM cell (SERSC-
16T) to provide complete resilience to single event upsets (SEU). The proposed cell is …
16T) to provide complete resilience to single event upsets (SEU). The proposed cell is …
Single-event multiple effect tolerant RHBD14T SRAM cell design for space applications
Static Random Access Memory (SRAM) is primarily used as a memory storage element,
which is susceptible to radiation-induced Single Event Upsets (SEUs). Hence, a robust …
which is susceptible to radiation-induced Single Event Upsets (SEUs). Hence, a robust …
A 32-nm subthreshold 7T SRAM bit cell with read assist
The implementation of the six-transistor (6T) static random access memory cell in deep
submicrometer region has become difficult due to the compromise between area, power …
submicrometer region has become difficult due to the compromise between area, power …
Design of high-reliability memory cell to mitigate single event multiple node upsets
H Li, L **ao, C Qi, J Li - … Transactions on Circuits and Systems I …, 2021 - ieeexplore.ieee.org
As technology scaling down, the sensitivity of SRAM cells to radiation-induced Single Event
Upsets (SEUs) increases, and Single Event Multiple Node Upsets (SEMNUs) due to charge …
Upsets (SEUs) increases, and Single Event Multiple Node Upsets (SEMNUs) due to charge …