Security closure of physical layouts ICCAD special session paper
Computer-aided design (CAD) tools traditionally optimize for power, performance, and area
(PPA). However, given a vast number of hardware security threats, we call for secure-by …
(PPA). However, given a vast number of hardware security threats, we call for secure-by …
A new characterization model of FinFET self-heating effect based on FinFET characteristic parameter
Y Wang, H Liang, H Zhang, D Li, Y Lu, M Yi… - Microelectronic …, 2024 - Elsevier
The characterization of the self-heating effect (SHE) has been an important research topic in
advanced technology, but the existing characterizations are few and the characterization …
advanced technology, but the existing characterizations are few and the characterization …
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor
In ever-shrinking technology nodes, where transistor 3D structures become increasingly
confined and their features verge on the atomic scale, the phenomena of aging and self …
confined and their features verge on the atomic scale, the phenomena of aging and self …
Self-heating effects from transistors to gates
VM van Santen, L Schillinger… - … Symposium on VLSI …, 2021 - ieeexplore.ieee.org
With the introduction of FinFET transistors, the Self-Heating Effect (SHE) became a major
reliability challenge. In this work, we present an automated SHE estimation method …
reliability challenge. In this work, we present an automated SHE estimation method …
A novel attack mode on advanced technology nodes exploiting transistor self-heating
Self-heating (SH) is a phenomenon that can induce excessive heat inside the transistor
channel. SH represents an emerging and serious concern, especially in advanced …
channel. SH represents an emerging and serious concern, especially in advanced …
Assessing Impact of Non-Uniform Localized Heating on Reliability
YJ Kim, EB Ramayya, L Jiang… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
Moore's Law-driven technology improvements have led to a significant increase in power
density across a multitude of market segments, from mobile to HEDT (high-end desktop) and …
density across a multitude of market segments, from mobile to HEDT (high-end desktop) and …
Self-Heating Influence on Hot Carrier Degradation Reliability of GAA FET by 3D KMC Method
S Zhao, P Zhao, Y He, G Du - 2023 International Conference on …, 2023 - ieeexplore.ieee.org
The self-heating coupling of the hot carrier degradation effect is studied in detail. The results
show that self-heating has a strong activation impact on hot carrier degradation. By …
show that self-heating has a strong activation impact on hot carrier degradation. By …
[PDF][PDF] Reliable Computing Using Ferroelectric Devices for Emerging AI Applications
S Chatterjee - 2024 - researchgate.net
Reliable Computing Using Ferroelectric Devices for Emerging AI Applications Page 1 Reliable
Computing Using Ferroelectric Devices for Emerging AI Applications A thesis submitted in …
Computing Using Ferroelectric Devices for Emerging AI Applications A thesis submitted in …
3D Electromigration Modelling for VLSI
Electromigration is an important failure mechanism in VLSI interconnections since the
inception of integrated circuits till now. The complexity of the underlying physics of …
inception of integrated circuits till now. The complexity of the underlying physics of …
[PDF][PDF] Design for Reliability and Low Power in Emerging Technologies
S Alsalamin - 2021 - researchgate.net
The most crucial growth driver for the semiconductor industry is transistors downscaling.
Consequently, for decades, circuits have become denser and more complex, following a …
Consequently, for decades, circuits have become denser and more complex, following a …