Security closure of physical layouts ICCAD special session paper

J Knechtel, J Gopinath, J Bhandari… - 2021 IEEE/ACM …, 2021 - ieeexplore.ieee.org
Computer-aided design (CAD) tools traditionally optimize for power, performance, and area
(PPA). However, given a vast number of hardware security threats, we call for secure-by …

A new characterization model of FinFET self-heating effect based on FinFET characteristic parameter

Y Wang, H Liang, H Zhang, D Li, Y Lu, M Yi… - Microelectronic …, 2024 - Elsevier
The characterization of the self-heating effect (SHE) has been an important research topic in
advanced technology, but the existing characterizations are few and the characterization …

Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor

H Amrouch, VM van Santen… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
In ever-shrinking technology nodes, where transistor 3D structures become increasingly
confined and their features verge on the atomic scale, the phenomena of aging and self …

Self-heating effects from transistors to gates

VM van Santen, L Schillinger… - … Symposium on VLSI …, 2021 - ieeexplore.ieee.org
With the introduction of FinFET transistors, the Self-Heating Effect (SHE) became a major
reliability challenge. In this work, we present an automated SHE estimation method …

A novel attack mode on advanced technology nodes exploiting transistor self-heating

N Rangarajan, J Knechtel, N Limaye… - … on Computer-Aided …, 2022 - ieeexplore.ieee.org
Self-heating (SH) is a phenomenon that can induce excessive heat inside the transistor
channel. SH represents an emerging and serious concern, especially in advanced …

Assessing Impact of Non-Uniform Localized Heating on Reliability

YJ Kim, EB Ramayya, L Jiang… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
Moore's Law-driven technology improvements have led to a significant increase in power
density across a multitude of market segments, from mobile to HEDT (high-end desktop) and …

Self-Heating Influence on Hot Carrier Degradation Reliability of GAA FET by 3D KMC Method

S Zhao, P Zhao, Y He, G Du - 2023 International Conference on …, 2023 - ieeexplore.ieee.org
The self-heating coupling of the hot carrier degradation effect is studied in detail. The results
show that self-heating has a strong activation impact on hot carrier degradation. By …

[PDF][PDF] Reliable Computing Using Ferroelectric Devices for Emerging AI Applications

S Chatterjee - 2024 - researchgate.net
Reliable Computing Using Ferroelectric Devices for Emerging AI Applications Page 1 Reliable
Computing Using Ferroelectric Devices for Emerging AI Applications A thesis submitted in …

3D Electromigration Modelling for VLSI

CM Tan, A Shabir, D Banerjee - 2022 IEEE 16th International …, 2022 - ieeexplore.ieee.org
Electromigration is an important failure mechanism in VLSI interconnections since the
inception of integrated circuits till now. The complexity of the underlying physics of …

[PDF][PDF] Design for Reliability and Low Power in Emerging Technologies

S Alsalamin - 2021 - researchgate.net
The most crucial growth driver for the semiconductor industry is transistors downscaling.
Consequently, for decades, circuits have become denser and more complex, following a …