Piezoresponse force microscopy and nanoferroic phenomena

A Gruverman, M Alexe, D Meier - Nature communications, 2019 - nature.com
Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has
become one of the mainstream techniques in the field of nanoferroic materials. This review …

Domain wall nanoelectronics

G Catalan, J Seidel, R Ramesh, JF Scott - Reviews of Modern Physics, 2012 - APS
Domains in ferroelectrics were considered to be well understood by the middle of the last
century: They were generally rectilinear, and their walls were Ising-like. Their simplicity …

Tunable quadruple-well ferroelectric van der Waals crystals

JA Brehm, SM Neumayer, L Tao, A O'Hara… - Nature Materials, 2020 - nature.com
The family of layered thio-and seleno-phosphates has gained attention as potential control
dielectrics for the rapidly growing family of two-dimensional and quasi-two-dimensional …

[HTML][HTML] Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

RK Vasudevan, N Balke, P Maksymovych… - Applied Physics …, 2017 - pubs.aip.org
Ferroelectric materials have remained one of the major focal points of condensed matter
physics and materials science for over 50 years. In the last 20 years, the development of …

[KSIĄŻKA][B] Domains in ferroic crystals and thin films

AK Tagantsev, LE Cross, J Fousek - 2010 - Springer
With much excitement and great enthusiasm I introduce this thorough treatise on the major
aspects of domain and domain wall phenomena in ferroics, mostly ferroelectrics, a major …

Quantification of the electromechanical measurements by piezoresponse force microscopy

P Buragohain, H Lu, C Richter, T Schenk… - Advanced …, 2022 - Wiley Online Library
Piezoresponse force microscopy (PFM) is widely used for characterization and exploration
of the nanoscale properties of ferroelectrics. However, quantification of the PFM signal is …

Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy

A Gruverman, O Auciello… - Annual review of materials …, 1998 - annualreviews.org
▪ Abstract Scanning force microscopy (SFM) is becoming a powerful technique with great
potential both for imaging and for control of domain structures in ferroelectric materials at the …

Nano-optical imaging and spectroscopy of order, phases, and domains in complex solids

JM Atkin, S Berweger, AC Jones… - Advances in …, 2012 - Taylor & Francis
The structure of our material world is characterized by a large hierarchy of length scales that
determines material properties and functions. Increasing spatial resolution in optical imaging …

Local potential and polarization screening on ferroelectric surfaces

SV Kalinin, DA Bonnell - Physical Review B, 2001 - APS
Electrostatic force microscopy and scanning surface potential microscopy are applied to
study force gradient and surface potential on BaTiO 3 (100) surface. Surface potential …

Piezoelectric measurements with atomic force microscopy

JA Christman, H Maiwa, SH Kim, AI Kingon… - MRS Online …, 1998 - cambridge.org
An atomic force microscope (AFM) is used to measure the magnitude of the effective
longitudinal piezoelectric constant (d33) of thin films. Measurements are performed with a …