Growth and properties of the dilute bismide semiconductor GaAs1− xBix a complementary alloy to the dilute nitrides
In this review we describe the growth and properties of the dilute bismide semiconductor
alloy GaAs1− xBix and show how its properties are in certain respects complementary to the …
alloy GaAs1− xBix and show how its properties are in certain respects complementary to the …
Temperature dependence of the Urbach edge in GaAs
The temperature dependence of the optical‐absorption edge (Urbach edge) of GaAs is
measured in semi‐insulating and n‐type GaAs (n= 2× 1018 cm− 3) over the temperature …
measured in semi‐insulating and n‐type GaAs (n= 2× 1018 cm− 3) over the temperature …
Molecular beam epitaxy technology of III-V compound semiconductors for optoelectronic applications
KY Cheng - Proceedings of the IEEE, 1997 - ieeexplore.ieee.org
Molecular beam epitaxy (MBE) is a highly precise and versatile crystal growth technique.
Since the first demonstration of quantum-well and superlattice structures in the early 1970's …
Since the first demonstration of quantum-well and superlattice structures in the early 1970's …
Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry
JT Zettler - Progress in Crystal Growth and Characterization of …, 1997 - Elsevier
The recent developments in optical real time analysis of epitaxial growth are reviewed.
Emphasis is placed on reflectance anisotropy spectroscopy (RAS) and spectroscopic …
Emphasis is placed on reflectance anisotropy spectroscopy (RAS) and spectroscopic …
Surface reconstructions during growth of GaAs1− xBix alloys by molecular beam epitaxy
An in-situ electron diffraction study of surface reconstructions on (001) oriented GaAs1− xBix
films has been carried out during growth by molecular beam epitaxy on GaAs substrates in …
films has been carried out during growth by molecular beam epitaxy on GaAs substrates in …
Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap
An optical method and apparatus for measuring the temperature of a substrate material with
a temperature dependent bandgap. The substrate is illuminated with a broad spectrum lamp …
a temperature dependent bandgap. The substrate is illuminated with a broad spectrum lamp …
Surface temperature measurement using optical techniques
ZM Zhang - Annual Review of Heat Transfer, 2000 - dl.begellhouse.com
Temperature is an important parameter in modern industrial processes, scientific research,
and daily life. Surface temperature measurement is essential to the field of heat transfer …
and daily life. Surface temperature measurement is essential to the field of heat transfer …
Complex dielectric function of as a function of Bi content
The complex dielectric constants of GaA s 1-x B ix alloys grown by molecular beam epitaxy
with x= 0% to 17% have been measured over the spectral range from 0.37 to 9.1 eV using …
with x= 0% to 17% have been measured over the spectral range from 0.37 to 9.1 eV using …
MBE growth optimization for GaAs1− xBix and dependence of photoluminescence on growth temperature
The effect of growth conditions on the electronic properties of GaAs 1− x Bi x grown on GaAs
by molecular beam epitaxy has been investigated by means of temperature dependent …
by molecular beam epitaxy has been investigated by means of temperature dependent …
Surface morphology of GaAs during molecular beam epitaxy growth: Comparison of experimental data with simulations based on continuum growth equations
Using atomic force microscopy and in situ elastic light scattering we show that the surface of
molecular beam epitaxy (MBE) grown GaAs tends towards an equilibrium roughness …
molecular beam epitaxy (MBE) grown GaAs tends towards an equilibrium roughness …