Growth and properties of the dilute bismide semiconductor GaAs1− xBix a complementary alloy to the dilute nitrides

T Tiedje, EC Young… - International Journal of …, 2008 - inderscienceonline.com
In this review we describe the growth and properties of the dilute bismide semiconductor
alloy GaAs1− xBix and show how its properties are in certain respects complementary to the …

Temperature dependence of the Urbach edge in GaAs

SR Johnson, T Tiedje - Journal of applied physics, 1995 - pubs.aip.org
The temperature dependence of the optical‐absorption edge (Urbach edge) of GaAs is
measured in semi‐insulating and n‐type GaAs (n= 2× 1018 cm− 3) over the temperature …

Molecular beam epitaxy technology of III-V compound semiconductors for optoelectronic applications

KY Cheng - Proceedings of the IEEE, 1997 - ieeexplore.ieee.org
Molecular beam epitaxy (MBE) is a highly precise and versatile crystal growth technique.
Since the first demonstration of quantum-well and superlattice structures in the early 1970's …

Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry

JT Zettler - Progress in Crystal Growth and Characterization of …, 1997 - Elsevier
The recent developments in optical real time analysis of epitaxial growth are reviewed.
Emphasis is placed on reflectance anisotropy spectroscopy (RAS) and spectroscopic …

Surface reconstructions during growth of GaAs1− xBix alloys by molecular beam epitaxy

M Masnadi-Shirazi, DA Beaton, RB Lewis, X Lu… - Journal of crystal …, 2012 - Elsevier
An in-situ electron diffraction study of surface reconstructions on (001) oriented GaAs1− xBix
films has been carried out during growth by molecular beam epitaxy on GaAs substrates in …

Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap

SR Johnson, C Lavoie, MK Nissen, JT Tiedje - US Patent 5,388,909, 1995 - Google Patents
An optical method and apparatus for measuring the temperature of a substrate material with
a temperature dependent bandgap. The substrate is illuminated with a broad spectrum lamp …

Surface temperature measurement using optical techniques

ZM Zhang - Annual Review of Heat Transfer, 2000 - dl.begellhouse.com
Temperature is an important parameter in modern industrial processes, scientific research,
and daily life. Surface temperature measurement is essential to the field of heat transfer …

Complex dielectric function of as a function of Bi content

M Mahtab, R Synowicki, V Bahrami-Yekta… - Physical Review …, 2019 - APS
The complex dielectric constants of GaA s 1-x B ix alloys grown by molecular beam epitaxy
with x= 0% to 17% have been measured over the spectral range from 0.37 to 9.1 eV using …

MBE growth optimization for GaAs1− xBix and dependence of photoluminescence on growth temperature

V Bahrami-Yekta, T Tiedje… - Semiconductor Science …, 2015 - iopscience.iop.org
The effect of growth conditions on the electronic properties of GaAs 1− x Bi x grown on GaAs
by molecular beam epitaxy has been investigated by means of temperature dependent …

Surface morphology of GaAs during molecular beam epitaxy growth: Comparison of experimental data with simulations based on continuum growth equations

A Ballestad, BJ Ruck, JH Schmid, M Adamcyk… - Physical Review B, 2002 - APS
Using atomic force microscopy and in situ elastic light scattering we show that the surface of
molecular beam epitaxy (MBE) grown GaAs tends towards an equilibrium roughness …