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Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
This article reviews the history and current progress in high-mobility strained Si, SiGe, and
Ge channel metal-oxide-semiconductor field-effect transistors (MOSFETs). We start by …
Ge channel metal-oxide-semiconductor field-effect transistors (MOSFETs). We start by …
Si/SiGe heterostructures: from material and physics to devices and circuits
DJ Paul - Semiconductor science and technology, 2004 - iopscience.iop.org
Silicon germanium (SiGe) has moved from being a research material to accounting for a
small but significant percentage of manufactured semiconductor devices. This percentage is …
small but significant percentage of manufactured semiconductor devices. This percentage is …
Band structure, deformation potentials, and carrier mobility in strained Si, Ge, and SiGe alloys
MV Fischetti, SE Laux - Journal of Applied Physics, 1996 - pubs.aip.org
Using nonlocal empirical pseudopotentials, we compute the band structure and shear
deformation potentials of strained Si, Ge, and SiGe alloys. Fitting the theoretical results to …
deformation potentials of strained Si, Ge, and SiGe alloys. Fitting the theoretical results to …
Strain effects on the thermal conductivity of nanostructures
Applying stress/strain on a material provides a mechanism to tune the thermal conductivity of
materials dynamically or on demand. Experimental and simulation results have shown that …
materials dynamically or on demand. Experimental and simulation results have shown that …
Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing
MT Currie, SB Samavedam, TA Langdo… - Applied physics …, 1998 - pubs.aip.org
A method of controlling threading dislocation densities in Ge on Si involving graded SiGe
layers and chemical-mechanical polishing (CMP) is presented. This method has allowed us …
layers and chemical-mechanical polishing (CMP) is presented. This method has allowed us …
Measurements of alloy composition and strain in thin GexSi1−x layers
JC Tsang, PM Mooney, F Dacol, JO Chu - Journal of applied physics, 1994 - pubs.aip.org
The utility of Raman spectroscopy for the simultaneous determination of composition and
strain in thin Ge x Si1− x layers has been investigated. Using data from the literature and …
strain in thin Ge x Si1− x layers has been investigated. Using data from the literature and …
[CARTE][B] Integrated silicon optoelectronics
H Zimmermann, H Zimmermann - 2010 - Springer
Since the first edition of this book, a lot of interesting integrated optoelectronic devices were
investigated and introduced in numerous publications. Therefore, Springer and me decided …
investigated and introduced in numerous publications. Therefore, Springer and me decided …
[CARTE][B] Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy
JD Cressler, S Monfray, G Freeman, D Friedman… - 2018 - taylorfrancis.com
An extraordinary combination of material science, manufacturing processes, and innovative
thinking spurred the development of SiGe heterojunction devices that offer a wide array of …
thinking spurred the development of SiGe heterojunction devices that offer a wide array of …
Plastic relaxation and relaxed buffer layers for semiconductor epitaxy
We present a critical review of the strategies used in the fabrication of mismatched
semiconductor heterostructures. By using simple concepts derived from the Matthews model …
semiconductor heterostructures. By using simple concepts derived from the Matthews model …
Mechanism and conditions for anomalous strain relaxation in graded thin films and superlattices
Compositionally graded films of SiGe/Si (100) and GaInAs/GaAs were grown under different
conditions in order to investigate the different modes of strain relaxation associated with the …
conditions in order to investigate the different modes of strain relaxation associated with the …