Overcoming size effects in ferroelectric thin films

SH Park, JY Kim, JY Song… - Advanced Physics …, 2023 - Wiley Online Library
Ferroelectric thin films have recently received unprecedented attention due to the need to
miniaturize electronic circuit devices. Synthesis and deposition processes along with …

Enhanced Endurance and Imprint Properties in Hf0.5Zr0.5O2−δ Ferroelectric Capacitors by Tailoring the Oxygen Vacancy

K Bao, J Liao, F Yan, S Jia, B Zeng… - ACS Applied …, 2023 - ACS Publications
HfO2-based ferroelectric thin films are promising in both memory and logic devices owing to
their compatibility with complementary metal-oxide-semiconductor platforms and excellent …

Structure, Oxygen Content and Electric Properties of Titanium Nitride Electrodes in TiNx/La:HfO2/TiNx Stacks Grown by PEALD on SiO2/Si

EI Suvorova, OV Uvarov, KV Chizh, AA Klimenko… - Nanomaterials, 2022 - mdpi.com
This work reports experimental results of the quantitative determination of oxygen and band
gap measurement in the TiNx electrodes in planar TiNx top/La: HfO2/TiNx bottom MIM …

All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium–Gallium–Zinc Oxide Channel

S Jeong, C Han, J Yim, J Kim, KR Kwon… - IEEE Electron …, 2023 - ieeexplore.ieee.org
Double-gate ferroelectric thin-film transistor (DG-FeTFT) with an amorphous indium–gallium–
zinc oxide (-IGZO) channel is demonstrated. DG-FeTFT is composed of all-sputter-deposited …

[HTML][HTML] Conductive filament formation in the failure of Hf0. 5Zr0. 5O2 ferroelectric capacitors

M Webb, T Chiang, MK Lenox, J Gray, T Ma… - APL Materials, 2025 - pubs.aip.org
Ferroelectric materials provide pathways to higher performance logic and memory
technologies, with Hf 0.5 Zr 0.5 O 2 being the most popular among them. However, critical …

Electron beam-induced current imaging of ferroelectric domains and local polarization reversal in Hf0. 5Zr0. 5O2

E Korostylev, V Mikheev, AG Chernikova… - Journal of Applied …, 2023 - pubs.aip.org
Because of their full compatibility with CMOS technology, HfO2-based ferroelectrics, and
especially Hf0. 5Zr0. 5O2 (HZO), attract a lot of attention. However, the overwhelming …

Chemical and electronic properties of interfaces between RuO2 and Hf0. 5Zr0. 5O2 studied by x-ray photoelectron spectroscopy

AG Chernikova, YY Lebedinskii, RR Khakimov… - Applied Physics …, 2023 - pubs.aip.org
Recently, the extensive study of the platinum group metal oxide electrodes for TiN
replacement in Hf 0.5 Zr 0.5 O 2 (HZO)-based ferroelectric memory stacks began. In this …

Wake-Up and Endurance Characteristics in Hf0.5Zr0.5O2-Based Metal-Ferroelectric-Metal Capacitor Depending on the Crystal Orientation of the TiN Bottom …

DH Han, AJ Lee, MK Nam, S Lee… - … on Electron Devices, 2023 - ieeexplore.ieee.org
The ferroelectric properties of Hf0. 5Zr0. 5O2 (HZO) according to the preferred orientations of
the titanium nitride (TiN) bottom electrode (BE) were investigated. The (111) and (200) …

Combined effects of the deposition temperature and metal electrodes on ferroelectric properties of atomic-layer-deposited Hf0. 5Zr0. 5O2 films

D Eom, J Lee, W Lee, J Oh, C Park, J Kim… - Journal of Physics D …, 2023 - iopscience.iop.org
The combined effects of the atomic-layer-deposition (ALD) temperature (220 C–280 C) and
metal electrodes (TiN and Mo) on the ferroelectric properties of Hf 0.5 Zr 0.5 O 2 films were …

Wake-up free La-doped ZrO2 antiferroelectric capacitors

J Li, J Zhou, F Wu, Z Weng, Y Huo… - Japanese Journal of …, 2024 - iopscience.iop.org
This study experimentally investigated La-doped ZrO 2 (ZLO) antiferroelectric (AFE)
capacitors. Significant polarization enhancement is demonstrated in ZLO antiferroelectric …