The atomic force microscope (AFM) system has evolved into a useful tool for direct
measurements of micro-structural parameters and unraveling the intermolecular forces at …

Nanoscience is a booming field incorporating some of the most fundamental questions
concerning structure, function, and applications. The cutting-edge research in nanoscience …

This book explains the operating principles of atomic force microscopy and scanning
tunneling microscopy. The aim of this book is to enable the reader to operate a scanning …

SINCE the invention of the scanning tunnelling microscope1, the value of establishing a
physical connection between the macroscopic world and individual nanometre-scale objects …

We have designed and tested a family of silicon nitride cantilevers ranging in length from 23
to 203 μm. For each, we measured the frequency spectrum of thermal motion in air and …

The general features of tap** mode operation of a scanning force microscope are
presented. Relevant factors of tap** mode such as forces, deformation, and contact times …

We describe the pulsed-force mode, a new measuring mode for the scanning force
microscope to image elastic, electrostatic and adhesive properties simultaneously with …

This new edition of the bestselling Microlithography: Science and Technology provides a
balanced treatment of theoretical and operational considerations, from elementary concepts …

We investigated the influence of the relative humidity on amplitude and phase of the
cantilever oscillation while operating an atomic force microscope (AFM) in the tap** mode …

Blends of two polymers, poly (ethene-co-styrene)(PES) and poly (2, 6-dimethyl-1, 4-
phenylene oxide)(PPO), were examined with tap** mode atomic force microscopy (AFM) …