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Soft error hardening enhancement analysis of NBTI tolerant Schmitt trigger circuit
Bias temperature instability (BTI) and soft errors are major reliability concerns for deep
submicron technologies. Negative BTI leads to an increase of the threshold voltage of PMOS …
submicron technologies. Negative BTI leads to an increase of the threshold voltage of PMOS …
A Novel Induced Offset Voltage Sensor for Separable Wear-Out Mechanism Characterization in a 12nm FinFET Process
Increasingly detailed predictive modelling and monitoring of semiconductor wear-out
benefits greatly from on-chip measurement of transistor degradation under different voltage …
benefits greatly from on-chip measurement of transistor degradation under different voltage …
A reactive and on-chip sensor circuit for NBTI and PBTI resilient SRAM design
Process Variation (PV), Bias Temperature Instability (BTI) and Time-Dependent Dielectric
Breakdown (TDDB) are the critical factors that affect the reliability of semiconductor chip …
Breakdown (TDDB) are the critical factors that affect the reliability of semiconductor chip …
Ingress of threshold voltage-triggered hardware trojan in the modern FPGA fabric–detection methodology and mitigation
The ageing phenomenon of negative bias temperature instability (NBTI) continues to
challenge the dynamic thermal management of modern FPGAs. Increased transistor density …
challenge the dynamic thermal management of modern FPGAs. Increased transistor density …
[HTML][HTML] Multipoint detection technique with the best clock signal closed-loop feedback to prolong fpga performance
The degradation effect of a field-programmable gate array becomes a significant issue due
to the high density of logic circuits inside the field-programmable gate array. The …
to the high density of logic circuits inside the field-programmable gate array. The …
A Novel Low-Power NMOS Schmitt Trigger Circuit Using Voltage Bootstrap** and Transistor Stacking
SS Kumar, S Akhila, TAK Reddy, AK Chaitanya… - … on Communications and …, 2023 - Springer
This research paper investigates and experiments with a low-power Schmitt circuit based on
transistor stacking. In the suggested VB-ST circuit, only an NMOS transistor is employed …
transistor stacking. In the suggested VB-ST circuit, only an NMOS transistor is employed …
Design for prognostics and security in field programmable gate arrays (FPGAs).
S Aslam - 2020 - dspace.lib.cranfield.ac.uk
There is an evolutionary progression of Field Programmable Gate Arrays (FPGAs) toward
more complex and high power density architectures such as Systems-on-Chip (SoC) and …
more complex and high power density architectures such as Systems-on-Chip (SoC) and …