Scanning tunnelling microscopy and atomic force microscopy can be used to study the
electronic and structural properties of surfaces, as well as molecules and nanostructures …

In this work, we spatially resolve by Kelvin probe force microscopy (KPFM) under ultrahigh
vacuum (UHV) the surface photovoltage in high-efficiency nanoscale phase segregated …

Insulating substrates allow for in-plane contacted molecular electronics devices where the
molecule is in contact with the insulator. For the development of such devices it is important …

While offering high resolution atomic and electronic structure, scanning probe microscopy
techniques have found greater challenges in providing reliable electrostatic characterization …

We report the contrast formation in the local contact potential difference (LCPD) measured
by Kelvin probe force microscopy (KPFM) on single charge-transfer complexes (CTCs) on a …

Kelvin probe force spectroscopy was used to characterize the charge distribution of
individual molecules with polar bonds. Whereas this technique represents the charge …

For the creation of smaller and smaller electrical devices and fundamental studies, Kelvin
Probe Force Microscopy (KPFM) offers a technique that measures the surface potential with …

Titanium dioxide (TiO2) is of considerable interest as a photocatalyst and a catalyst support.
Surface hydroxyl groups (OH) are the most common adsorbates on the TiO2 surface and are …

The effect of stray capacitance on potential measurements was investigated using Kelvin
probe force microscopy (KPFM) at room temperature under ultra-high vacuum (UHV). The …

A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force
microscopy is presented. Atomistic simulations of the tip-sample interaction force field have …