Force calibration in lateral force microscopy: a review of the experimental methods

M Munz - Journal of Physics D: Applied Physics, 2010 - iopscience.iop.org
Lateral force microscopy (LFM) is a variation of atomic/scanning force microscopy
(AFM/SFM). It relies on the torsional deformation of the AFM cantilever that results from the …

Nanoscale Electron Transfer Variations at Electrocatalyst–Electrolyte Interfaces Resolved by in Situ Conductive Atomic Force Microscopy

M Munz, J Poon, W Frandsen… - Journal of the …, 2023 - ACS Publications
Rational innovation of electrocatalysts requires detailed knowledge of spatial property
variations across the solid–electrolyte interface. We introduce correlative atomic force …

Imaging and measurement of elasticity and friction using the TRmode

M Reinstädtler, T Kasai, U Rabe… - Journal of Physics D …, 2005 - iopscience.iop.org
Torsional and lateral vibrations of atomic force microscope (AFM) cantilevers can be used to
measure elastic and frictional properties on a nanoscale. Recently a new dynamic operation …

[BOK][B] Applied scanning probe methods VI

B Bhushan, H Fuchs - 2007 - Springer
The scanning probe microscopy field has been rapidly expanding. It is a demanding task to
collect a timely overview of this field with an emphasis on technical developments and …

Fluid phase transitions at chemically heterogeneous, nonplanar solid substrates: Surface versus confinement effects

S Sacquin, M Schoen, AH Fuchs - The Journal of chemical physics, 2003 - pubs.aip.org
The phase behavior of a “simple” Lennard-Jones (12, 6) fluid confined between planar
substrates has been investigated by means of Monte Carlo simulations in the grand …

Scanning force microscopic investigations of the femtosecond laser pulse irradiation of indium phosphide in air

J Bonse, M Munz, H Sturm - IEEE transactions on …, 2004 - ieeexplore.ieee.org
Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of
linearly polarized Ti: sapphire femtosecond pulses (800 nm, 130 fs, 10 Hz). As a result of the …

Fluid bridges confined between chemically nanopatterned solid substrates

M Schoen - Physical chemistry chemical physics, 2008 - pubs.rsc.org
We discuss equilibrium properties of classical fluids confined to nanoscopic volumes by
solid substrates. The substrates themselves are endowed with wettable chemical patterns of …

Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites

M Munz, B Cappella, H Sturm, M Geuss… - Filler-Reinforced …, 2003 - Springer
Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has
proved to be valuable both for map** of various materials properties and for modifying …

[BOK][B] Filler-reinforced elastomers scanning force microscopy

B Cappella, M Geuss, M Klüppel, M Munz, E Schulz… - 2004 - books.google.com
The two volumes 165 and 166 Polyelectrolytes with Defined Molecular Architecture
summarize recent progress in the field. The subjects comprise novel polyelectrolyte …

Atomic force microscopy with lateral modulation

B Bhushan, H Fuchs, S Hosaka, V Scherer… - Applied scanning probe …, 2004 - Springer
Friction is present in our every day lives. There are unwanted phenomena such as energy
loss in the relative motion of contacting surfaces (eg, gears, bearings or sealings). For …