An analytical charge model for double-gate tunnel FETs

L Zhang, X Lin, J He, M Chan - IEEE Transactions on Electron …, 2012 - ieeexplore.ieee.org
An analytical charge model for double gate (DG) tunnel FETs (TFETs) is proposed. By
splitting the TFET into a series combination of a gated tunnel diode and a DG MOSFET, we …

Modeling, Simulation and Analysis of Surface Potential and Threshold Voltage: Application to High-K Material HfO2 Based FinFET

S Panchanan, R Maity, S Baishya, NP Maity - Silicon, 2021 - Springer
In this study, an analytical model for surface potential and threshold voltage for undoped (or
lightly) doped tri-gate Fin Field Effect Transistor (TG-FinFET) is proposed and validated …

Role of Fin Shape on Drain Current of SiO2/HfO2 Based Trigate FinFET Including Quantum Mechanical Effect

S Panchanan, R Maity, A Baidya, NP Maity - Silicon, 2023 - Springer
A compact Lambert W function-based model is proposed to analyze the drain current of
three different fin-shaped Trigate (TG) FinFETs, namely rectangular (RE_TG), trapezoidal …

Triple metal surrounding gate junctionless tunnel FET based 6T SRAM design for low leakage memory system

GL Priya, M Venkatesh, NB Balamurugan, TSA Samuel - Silicon, 2021 - Springer
The promising capability of Triple Material Surrounding Gate Junctionless Tunnel FET
(TMSG–JL–TFET) based 6 T SRAM structure is demonstrated by employing Germanium …

A universal core model for multiple-gate field-effect transistors. Part I: Charge model

JP Duarte, SJ Choi, DI Moon, JH Ahn… - … on Electron Devices, 2012 - ieeexplore.ieee.org
A universal core model for multiple-gate field-effect transistors (Mug-FETs) is proposed. The
proposed charge and drain current models are presented in Parts I and II, respectively. It is …

A compact model for double-gate heterojunction tunnel FETs

Y Dong, L Zhang, X Li, X Lin… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
A compact model for generic heterojunction tunnel FETs (H-TFET) is developed to simulate
H-TFET formed by different source/body material systems. The model is based on the device …

Compact model of drain current in short-channel triple-gate FinFETs

N Fasarakis, A Tsormpatzoglou… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
An analytical compact drain current model for undoped (or lightly doped) short-channel triple-
gate fin-shaped field-effect transistors (finFETs) is presented, taking into account quantum …

A universal core model for multiple-gate field-effect transistors. Part II: Drain current model

JP Duarte, SJ Choi, DI Moon, JH Ahn… - … on Electron Devices, 2013 - ieeexplore.ieee.org
A universal drain current model for multiple-gate field-effect transistors (FETs)(Mug-FETs) is
proposed. In Part I, a universal charge model was derived using the arbitrary potential …

Subthreshold modeling of tri-gate junctionless transistors with variable channel edges and substrate bias effects

D Gola, B Singh, PK Tiwari - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, subthreshold channel potential, current, swing, threshold voltage, and drain-
induced barrier lowering models of short-channel tri-gate junctionless field-effect transistors …

Analytical model of center potential in GaN vertical junctionless power Fin-MOSFETs for fast device-design optimization

J Patel, T Pramanik, B Sarkar - IEEE Transactions on Electron …, 2023 - ieeexplore.ieee.org
In this work, we present an analytical model for fast optimization of gallium nitride vertical
junctionless (VJ) power Fin-MOSFET device design. The derived model faithfully captures …