Substoichiometric zirconia thin films prepared by reactive sputtering of metallic zirconium using a direct current ion beam source
T Götsch, B Neumann, B Klötzer, S Penner - Surface Science, 2019 - Elsevier
An ultra-high-vacuum-compatible direct current ion beam sputter source is used to deposit
strongly defective zirconium dioxide thin films by operation in high vacuum with different …
strongly defective zirconium dioxide thin films by operation in high vacuum with different …
Preparation of sol-gel ZrO2 films with high laser-induced damage threshold under high temperature
Y Zhu, M Ma, P Zhang, W Cai, D Li, C Xu - Optics Express, 2019 - opg.optica.org
In this study, three different types of ZrO_2 films were prepared with different precursors and
additives using the sol-gel method. High-temperature annealing was implemented to …
additives using the sol-gel method. High-temperature annealing was implemented to …
Crystal growth kinetics of ultra-thin ZrO2 film on Si by differential scanning calorimetry
Crystal growth kinetics of thin ZrO 2 film deposited on Si is described in the framework of
Johnson, Mehl and Avrami (JMA) equation and Kissinger method. Differential scanning …
Johnson, Mehl and Avrami (JMA) equation and Kissinger method. Differential scanning …