Resonant inelastic X-ray scattering (RIXS) is a powerful technique that combines
spectroscopy and inelastic scattering to probe the electronic structure of materials. RIXS is …

In the past decade, resonant inelastic x-ray scattering (RIXS) has made remarkable progress
as a spectroscopic technique. This is a direct result of the availability of high-brilliance …

Knowledge of the structure of catalysts is essential to understand their behavior, which
further facilitates development of an active, selective, and stable catalyst. Determining the …

We describe the chemical information that can be obtained by means of hard X-ray emission
spectroscopy (XES). XES is presented as a technique that is complementary to X-ray …

Abstract A 2D photon-counting X-ray detector system with 1.4 kHz frame rate and 55 μm
spatial resolution has been developed and commissionned on ESRF beamlines. The …

The GALAXIES beamline at the SOLEIL synchrotron is dedicated to inelastic X-ray scattering
(IXS) and photoelectron spectroscopy (HAXPES) in the 2.3–12 keV hard X-ray range. These …

An end-station for resonant inelastic X-ray scattering and (resonant) X-ray emission
spectroscopy at beamline ID20 of ESRF–The European Synchrotron is presented. The …

This chapter reviews nonresonant, meV-resolution inelastic x-ray scattering (IXS), as applied
to the measurement of atomic dynamics of crystalline materials. It, in conjunction with a …

Over the last three decades low-dimensional systems have attracted increasing interest both
from the fundamental and technological points of view due to their unique physical and …

X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that
employ more than one analyzer crystal poses challenges with respect to mechanical design …