自比特币被提出以来, 数字货币开启了新的时代, 而其背后的区块链技术也逐渐受到各界人士的
重视. 共识机制作为区块链技术的核心, 决定了区块链的安全性, 可扩展性和去中心化程度等许多 …

A new low-power (LP) scan-based built-in self-test (BIST) technique is proposed based on
weighted pseudorandom test pattern generation and reseeding. A new LP scan architecture …

This paper presents an innovative method for inserting test points in the circuit-under-test to
obtain complete fault coverage for a specified set of test patterns. Rather than using …

This article surveys test point (TP) architectures and test point insertion (TPI) methods for
increasing pseudo-random and logic built-in self-test (LBIST) fault coverage. We present a …

This paper presents a new test data-compression scheme that is a hybrid approach between
external testing and built-in self-test (BIST). The proposed approach is based on weighted …

Two noble scan based BIST architectures, namely parallel fixing and serial fixing BIST,
which can be implemented at very low hardware cost even for random pattern resistant …

This paper presents a low hardware overhead test pattern generator (TPG) for scan-based
built-in self-test (BIST) that can reduce switching activity in circuits under test (CUTs) during …

This paper presents a low hardware overhead test pattern generator (TPG) for scan-based
BIST that can reduce switching activity in CUTs during BIST and also achieve very high fault …

This paper describes a low-power (LP) programmable generator capable of producing
pseudorandom test patterns with desired toggling levels and enhanced fault coverage …

An increasing part of microelectronic systems is implemented on the basis of predesigned
and preverified modules, so-called cores, which are reused in many instances. Core …