Demonstration of a nanosheet FET with high thermal conductivity material as buried oxide: Mitigation of self-heating effect

S Rathore, RK Jaisawal, PN Kondekar… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Self-heating-induced thermal degradation is a severe issue in nonplanar MOS architectures.
Especially in stacked gate-all-around (GAA) nanosheet FET (NSFET), the self-heating effect …

A perspective view of silicon based classical to non-classical mos transistors and their extension in machine learning

AP Singh, VK Mishra, S Akhter - Silicon, 2023 - Springer
Unprecedented growth in CMOS technology and demand of high-density integrated circuits
(ICs) in semiconductor industry has motivated to research community towards the …

Common source amplifier and ring oscillator circuit performance optimization using multi-bridge channel FETs

VB Sreenivasulu, NA Kumari, V Lokesh… - ECS Journal of Solid …, 2023 - iopscience.iop.org
In this paper the DC, analog/RF device and circuit applications of nanosheet (NS) FET is
performed. To enhance power performance co-optimization geometry parameters like NS …

A comprehensive analysis of nanosheet FET and its CMOS circuit applications at elevated temperatures

NA Kumari, P Prithvi - Silicon, 2023 - Springer
Abstract The Nanosheet Field Effect Transistor (NSFET) has been shown to be a viable
candidate for sub-7-nm technology nodes. This paper assesses and compares the NSFET …

Unveiling the self-heating and process variation reliability of a junctionless FinFET-based hydrogen gas sensor

N Gandhi, S Rathore, RK Jaisawal… - IEEE Sensors …, 2023 - ieeexplore.ieee.org
Field-effect-transistor-based sensors are essential for environmental monitoring, industrial
analyte detection, medical diagnosis, etc. This letter unveiled the process variation, self …

A proof of concept for reliability aware analysis of junctionless negative capacitance FinFET-based hydrogen sensor

N Gandhi, RK Jaisawal, S Rathore… - Smart Materials and …, 2024 - iopscience.iop.org
This work demonstrates the reliability-aware analysis of the Junctionless negative
capacitance (NC) FinFET employed as a hydrogen (H 2) gas sensor. Gate stacking of the …

Self-heating and interface traps assisted early aging revelation and reliability analysis of negative capacitance FinFET

RK Jaisawal, S Rathore, N Gandhi… - 2023 7th IEEE …, 2023 - ieeexplore.ieee.org
The realization of a Negative Capacitance (NC) phenomenon in TCAD, considering several
realistic aspects of transport physics, remains challenging. In this paper, we investigated the …

Unveiling the reliability of negative capacitance FinFET with confrontation of different HfO2-ferroelectric dopants

RK Jaisawal, S Rathore, PN Kondekar, N Bagga - Solid-State Electronics, 2024 - Elsevier
The CMOS compatibility of Negative Capacitance (NC) FETs has been enhanced
tremendously after introducing a thin film-doped HfO 2 as a ferroelectric (FE) layer. For a …

Analog/RF and linearity performance assessment of a negative capacitance FinFET using high threshold voltage techniques

RK Jaisawal, S Rathore, PN Kondekar… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
The continued exploration of the ferroelectric-based negative capacitance field effect
transistor (NCFET) for energy-efficient and higher current drivability merits has called for an …

Self-heating aware threshold voltage modulation conforming to process and ambient temperature variation for reliable nanosheet FET

S Rathore, RK Jaisawal, PN Kondekar… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
Internal and external process variations severely affect the device threshold voltage (V_th)
and, in turn, the device's reliability. For the first time, this paper presented a thorough …