In the last five decades, the number of transistors on a chip has increased exponentially in
accordance with the Moore's law, and the semiconductor industry has followed this law as …

Following their first observation in 1984, random telegraph signals (RTSs) were initially a
purely scientific tool to study fundamental aspects of defects in semiconductor devices. As …

While defects are undesirable for the reliability of electronic devices, particularly in scaled
microelectronics, they have proven beneficial in numerous quantum and energy-harvesting …

High-density Solid State Drives (SSDs) have to use Low-Density Parity-Check (LDPC)
codes to store data reliably. Current LDPC implementations apply multiple read-retry steps …

Reconfigurable field effect transistors are one of the most promising emerging device
concepts for future computing systems, due to their dynamic p-and n-channel behavior. Over …

We propose an In-Memory Computing (IMC) scheme to implement Fast Fourier Transform
(FFT) for noise signal processing using flash memory. By taking advantage of the algorithms …

This paper presents an innovative and automated measurement setup for the
characterization of variability effects in CMOS transistors using array-based integrated …

The RCL Shunted-Josephson Junction (RCLSJJ) circuit models are complex. They show
chaotic behaviour due to internal and external perturbations such as environmental noise …

As the generally-accepted simple understanding, the random telegraph noise (RTN)
induced by a single trap is explained by the “normal” two-state trap model, and the RTNs …

This article presents a new methodology to extract, at a given operation condition, the
statistical distribution of the number of active defects that contribute to the observed device …