Study of the Effect of Thickness on the Optical Properties of MnBi0. 95Sb0. 05 Thin Film
MnBi0. 95Sb0. 05 alloys were prepared by the conventional melt technique and then
deposited as a thin film by thermal evaporation technique with different thicknesses. The …
deposited as a thin film by thermal evaporation technique with different thicknesses. The …
[HTML][HTML] Effect of gamma irradiation on the linear and non-linear optical properties of magnetron Co-sputtered CdO–SnO2 thin films
MM Abd El-Raheem, SA Mohamed - Radiation Physics and Chemistry, 2024 - Elsevier
Abstract In this work, CdO–SnO 2 thin films were deposited using the magnetron Co-
sputtering technique. The presence of single-phase Cadmium Stannate (Cd 2 SnO 4) films …
sputtering technique. The presence of single-phase Cadmium Stannate (Cd 2 SnO 4) films …
[HTML][HTML] Structural, optical, and electrical characteristics of Ge18Bi4Se78 chalcogenide glass for optoelectronic applications
SK Mohamed, MM Abd El-Raheem, MM Wakkad… - … , Devices, Circuits and …, 2023 - Elsevier
The melt quenching and thermal evaporation techniques were used to produce the
chalcogenide glass Ge 18 Bi 4 Se 78 powder and thin film samples, respectively. The as …
chalcogenide glass Ge 18 Bi 4 Se 78 powder and thin film samples, respectively. The as …
[PDF][PDF] Memories-Materials, Devices, Circuits and Systems
SK Mohamed, MM Abd El-Raheem, MM Wakkad… - researchgate.net
The melt quenching and thermal evaporation techniques were used to produce the
chalcogenide glass Ge18B-i4Se78 powder and thin film samples, respectively. The as …
chalcogenide glass Ge18B-i4Se78 powder and thin film samples, respectively. The as …
Kinetics of Non-Isothermal Crystallization and Glass Transition Phenomena in Te15sn2. 5se82. 5 Chalcogenide Glasses
A El-Raheem, A Ahmed, HF Mohamed… - Available at SSRN … - papers.ssrn.com
The method of melt quench is used to prepare Te15Sn2. 5Se82. 5 chalcogenide glass. The
sample is characterized using X-ray diffraction (XRD) and a scan electron microscope …
sample is characterized using X-ray diffraction (XRD) and a scan electron microscope …