Vertical GAAFETs for the ultimate CMOS scaling

D Yakimets, G Eneman, P Schuddinck… - … on Electron Devices, 2015 - ieeexplore.ieee.org
In this paper, we compare the performances of FinFETs, lateral gate-all-around (GAA) FETs,
and vertical GAAFETs (VFETs) at 7-nm node dimensions and beyond. Comparison is done …

Circuit analysis and optimization of GAA nanowire FET towards low power and high switching

VB Sreenivasulu, V Narendar - Silicon, 2022 - Springer
The main aim of this work is to study the effect of symmetric and asymmetric spacer length
variations towards source and drain on n-channel SOI JL vertically stacked (VS) nanowire …

Vertical nanowire FET integration and device aspects

A Veloso, E Altamirano-Sánchez, S Brus… - ECS …, 2016 - iopscience.iop.org
This work reports on vertical nanowire FET devices (VNWFETs) with a gate-all-around
(GAA) configuration, which offer new, promising opportunities to enable further CMOS …

Vertical device architecture for 5nm and beyond: device & circuit implications

AVY Thean, D Yakimets, TH Bao… - 2015 Symposium on …, 2015 - ieeexplore.ieee.org
Vertical nanowire logic circuits may enable device density scaling well beyond lateral CMOS
layouts limited by gate and contact placement. In this paper, we compared the performance …

A novel circular double-gate SOI MOSFET with raised source/drain

S Kallepelli, S Maheshwaram - Semiconductor Science and …, 2021 - iopscience.iop.org
In this paper, we report the performance of a novel circular double-gate (CDGT) silicon-on-
insulator metal oxide semiconductor field effect transistor (MOSFET). We explore a variety of …

Analysis of electrothermal characteristics of GAA vertical nanoplate-shaped FETs

D Son, I Myeong, H Kim, M Kang… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, the thermal and electrical characteristics of a gate-all-around (GAA) vertical
nanoplate-shaped field-effect transistor (NPFET) are studied for sub-5-nm technologies …

Refined conformal map** model for MOSFET parasitic capacitances based on elliptic integrals

G Hiblot, Q Rafhay, F Boeuf… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
In this paper, the main MOSFET parasitic capacitances of planar devices (ie, bulk, Fully
depleted silicon-on-insulator (FDSOI), and planar double gate) are computed using two …

Simulation of different structured gate-all-around FETs for 2 nm node

N Totorica, W Hu, F Li - Engineering Research Express, 2024 - iopscience.iop.org
This paper compares different types of Gate All Around (GAA) FET structures using TCAD
simulation, including Lateral Nanosheet, Lateral Nanowire, Vertical Nanosheet, and Vertical …

Lateral versus vertical gate-all-around FETs for beyond 7nm technologies

D Yakimets, TH Bao, MG Bardon… - 72nd Device …, 2014 - ieeexplore.ieee.org
Nominal LG VFET-based RO may operate up to~ 60% faster than LFET-based RO at the
same energy per switch for both 7nm and 5nm technology nodes depending on the layout …

A novel vertically stacked circular nanosheet FET for high-performance applications

S Kallepelli, S Maheshwaram - ECS Journal of Solid State …, 2022 - iopscience.iop.org
Nanosheet MOSFETs with circular layout geometry, ie Circular Nanosheet MOSFETs (C-
NSFETs) are explored using fully calibrated TCAD for High performance (HP) applications at …