Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the ferroelectric properties
Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the
ferroelectric properties | Journal of Applied Physics | AIP Publishing Skip to Main Content …
ferroelectric properties | Journal of Applied Physics | AIP Publishing Skip to Main Content …
Giant energy storage density in lead-free dielectric thin films deposited on Si wafers with an artificial dead-layer
X Chen, B Peng, MJ Ding, X Zhang, B **e, T Mo… - Nano Energy, 2020 - Elsevier
High-performance lead-free thin-film capacitors deposited on the silicon (Si) wafers with
large energy storage density (W) and high reliability are strongly attractive in the modern …
large energy storage density (W) and high reliability are strongly attractive in the modern …
Carrier type exchange with the sweep direction in a WORM memory device
In the present study, we have investigated the charge transport mechanism of the resistive
switching phenomenon of a write-once-read-many-times (WORM)-type memory device …
switching phenomenon of a write-once-read-many-times (WORM)-type memory device …
Luminescence induced by elastic deformation of ZnS: Mn nanoparticles
When the thin film of ZnS: Mn nanoparticles deposited on a glass substrate is elastically
deformed by applying a load, then initially the mechanoluminescence (ML) intensity …
deformed by applying a load, then initially the mechanoluminescence (ML) intensity …
Environmentally friendly resistive switching memory devices with DNA as the active layer and bio-based polyethylene furanoate as the substrate
JY Lam, GW Jang, CJ Huang, SH Tung… - ACS Sustainable …, 2020 - ACS Publications
The development of flexible electronics for wearable or implantable devices has become an
exciting research area in recent years. With the transition from rigid to flexible devices …
exciting research area in recent years. With the transition from rigid to flexible devices …
Confirmation of charge carriers' types based on HOMO-LUMO positions in the active layer of a WORM memory device
In this communication, we have tried to explain the experimental observation of the flow of
opposite charge carriers (electrons and holes) in a Write Once Read Many times (WORM) …
opposite charge carriers (electrons and holes) in a Write Once Read Many times (WORM) …
Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors
JD Baniecki, T Shioga, K Kurihara… - Journal of applied …, 2003 - pubs.aip.org
Modeling the current density–applied voltage (J–VA) characteristics of perovskite titanate-
based high dielectric constant high-K and ferroelectric thin film capacitors, and …
based high dielectric constant high-K and ferroelectric thin film capacitors, and …
Effects of porosity on ferroelectric properties of Pb (Zr0. 2Ti0. 8) O3 films
V Stancu, M Lisca, I Boerasu, L Pintilie, M Kosec - Thin Solid Films, 2007 - Elsevier
The sol–gel deposition method has been successfully applied to obtain Pb (Zr0. 2Ti0. 8) O3
thin films on platinized silicon wafers. Addition of different amounts (7–15 wt.%) of organic …
thin films on platinized silicon wafers. Addition of different amounts (7–15 wt.%) of organic …
Interface-engineering-enhanced energy storage performance of (Na0. 8K0. 2) 0.5 Bi4. 5Ti4O15/Bi4LaTi3. 5Mg0. 5O15 multilayer film capacitors
R Ge, J Yang, S Zeng, Y Zhang, W Bai… - Materials Science and …, 2024 - Elsevier
Dielectric capacitors are vital components in advanced electrical power systems due to their
high power density. However, how to improve their comparatively low energy density is still …
high power density. However, how to improve their comparatively low energy density is still …
Greatly enhanced breakdown strength of Pt/LNO/BST/Au thin films by regulating the space charge limited current though the dielectrics/electrode interface …
X Chen, Y Zhang, B **e, W Wang, MJ Ding… - Journal of Alloys and …, 2020 - Elsevier
Carrier injection is the most common and critical issue which significantly affects the electric
breakdown strength (E b) of the dielectric films since the dielectric thin films usually work …
breakdown strength (E b) of the dielectric films since the dielectric thin films usually work …