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Precision Interface Engineering of CuNi Alloys by Powder ALD Toward Better Thermoelectric Performance
The main bottleneck in obtaining high‐performance thermoelectric (TE) materials is
identified as how to decouple the strong interrelationship between electrical and thermal …
identified as how to decouple the strong interrelationship between electrical and thermal …
Tuning of the plasmon resonance location in Au nanostructures coated with a ultrathin film of Al2O3–Optical measurements and FDTD simulations
M Łapiński, R Kozioł, P Syty, S Patela, JE Sienkiewicz… - Surface Science, 2023 - Elsevier
The Au nanostructures have been coated with an ultra-thin films of amorphous aluminium
oxide. Optical absorption spectra show the influence of the thickness of Al 2 O 3 on plasmon …
oxide. Optical absorption spectra show the influence of the thickness of Al 2 O 3 on plasmon …
Atomic Layer Deposition Growth and Characterization of Al2O3 Layers on Cu-Supported CVD Graphene
P Rafailov, V Mehandzhiev, P Sveshtarov, B Blagoev… - Coatings, 2024 - mdpi.com
The deposition of thin uniform dielectric layers on graphene is important for its successful
integration into electronic devices. We report on the atomic layer deposition (ALD) of Al2O3 …
integration into electronic devices. We report on the atomic layer deposition (ALD) of Al2O3 …
Nanoscale film thickness gradients printed in open air by spatially varying chemical vapor deposition
AH Alshehri, JY Loke, VH Nguyen… - Advanced Functional …, 2021 - Wiley Online Library
Nanoscale films are integral to all modern electronics. To optimize device performance,
researchers vary the film thickness by making batches of devices, which is time‐consuming …
researchers vary the film thickness by making batches of devices, which is time‐consuming …
Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications
C Barbos, D Blanc-Pelissier, A Fave, C Botella… - Thin Solid Films, 2016 - Elsevier
Al 2 O 3 thin films with thickness between 2 and 100 nm were synthetized at 250° C by
thermal atomic layer deposition on silicon substrates. Characterizations of as-deposited and …
thermal atomic layer deposition on silicon substrates. Characterizations of as-deposited and …
[PDF][PDF] Spatial Atomic Layer Deposition for Energy and Electronic Devices
Functional thin films play a critical role in efforts toward efficient devices for energy
conversion and storage, as well as low-loss electronics. These films need to be …
conversion and storage, as well as low-loss electronics. These films need to be …
Study of aluminium oxide thin films deposited by plasma-enhanced atomic layer deposition from tri-methyl-aluminium and dioxygen precursors: Investigation of …
A Lale, E Scheid, F Cristiano, L Datas, B Reig… - Thin Solid Films, 2018 - Elsevier
Abstract Aluminium oxide (Al 2 O 3) films were deposited on silicon substrates using plasma-
enhanced atomic layer deposition (PE-ALD) technique with tri-methyl-aluminium TMA (Al …
enhanced atomic layer deposition (PE-ALD) technique with tri-methyl-aluminium TMA (Al …
[HTML][HTML] Photonic materials for high-temperature applications: Synthesis and characterization by X-ray ptychographic tomography
Photonic materials for high-temperature applications need to withstand temperatures usually
higher than 1000° C, whilst kee** their function. When exposed to high temperatures …
higher than 1000° C, whilst kee** their function. When exposed to high temperatures …
A Low‐Temperature Batch Process for the Deposition of High‐Quality Conformal Alumina Thin Films for Electronic Applications
High‐quality, alumina thin films are extensively used as dielectrics, passivation layers, and
barrier layers in electronics and many other applications. However, to achieve optimum …
barrier layers in electronics and many other applications. However, to achieve optimum …
Bandgap modulation and electrical characteristics of (AlxGa1− x) 2O3/4H-SiC thin film heterostructures
In this work,(Al x Ga 1− x) 2 O 3 thin films were grown on a 4H-SiC substrate by radio
frequency (RF) sputtering.(Al x Ga 1− x) 2 O 3 targets with different nominal Al content xt: 0 …
frequency (RF) sputtering.(Al x Ga 1− x) 2 O 3 targets with different nominal Al content xt: 0 …