Kelvin Probe Force Microscopy under variable illumination: a novel technique to unveil charge carrier dynamics in GaN

P González-Izquierdo, N Rochat… - The Journal of …, 2023 - ACS Publications
GaN is a widely used material for optical and power devices. However, the performance of
GaN-based devices is often reduced by charge trap** processes due to defect levels in …

Observation and modeling of leakage current in AlGaN ultraviolet light emitting diodes

T Tao, T Zhi, B Liu, J Lei, J Dai, Z **e… - IEEE Photonics …, 2019 - ieeexplore.ieee.org
Current-voltage (IV) characteristics of AlGaN ultraviolet light-emitting diodes (UV-LEDs)
under the temperatures ranging from 50 K to 300 K are analyzed. The abnormal diode …

[HTML][HTML] Counter-intuitive junction temperature behavior in AlGaN-based deep-ultraviolet light-emitting diodes

DY Kim, J Park, J Cho, JK Kim - AIP Advances, 2020 - pubs.aip.org
The junction temperature, one of the major parameters that strongly affect the performance
of light-emitting diodes (LEDs), increases during operation because of the power dissipated …

Research on 1/f noise degradation of GaN LED caused by γ radiation under high bias

Q Zhao, X Lu, J Xu, F Yu, Z **can… - … Science and Technology, 2020 - iopscience.iop.org
GaN-based blue light-emitting diodes (LEDs) were radiated with 60 Co γ-rays for an
accumulated dose of up to 2.5 Mrad (SiO 2). The radiation-induced current and 1/f noise …

Analysis of Deep-Trap States in GaN/InGaN Ultraviolet Light-Emitting Diodes after Electrical Stress

S Jeong, H Kim, SN Lee - Journal of the Korean Physical Society, 2018 - Springer
We analyzed the deep-trap states of GaN/InGaN ultraviolet light-emitting diodes (UV LEDs)
before and after electrical stress. After electrical stress, the light output power dropped by …