Resolving localized geometrically necessary dislocation densities in Al-Mg polycrystal via in situ EBSD

H Zhong, Q Shi, C Dan, X You, S Zong, S Zhong… - Acta Materialia, 2024 - Elsevier
The distribution of geometrically necessary dislocation (GND) densities is critical to
understanding the heterogeneous plastic deformation at intragranular scales in polycrystals …

Experimental measurement of dislocation density in metallic materials: A quantitative comparison between measurements techniques (XRD, R-ECCI, HR-EBSD, TEM)

J Gallet, M Perez, R Guillou, C Ernould… - Materials …, 2023 - Elsevier
The dislocation densities were measured on the same samples using transmission electron
microscopy (TEM), scanning electron microscopy (electron channeling contrast imaging …

Finite Element Model Updating for Material Model Calibration: A Review and Guide to Practice

B Chen, B Starman, M Halilovič, LA Berglund… - … Methods in Engineering, 2024 - Springer
Finite element model updating (FEMU) is an advanced inverse parameter identification
method capable of identifying multiple parameters in a material model through one or a few …

Water droplet erosion assessment in the initial stages on AISI 316 L using kernel average misorientation

J Poloprudský, Š Gamanov, A Chlupová, D Klichová… - Tribology …, 2024 - Elsevier
Surfaces exposed to natural forces in the form of water droplets are structurally deformed
over time through changes in their surface morphology. Plastic deformation in thin …

Novel remap** approach for HR-EBSD based on demons registration

C Zhu, K Kaufmann, KS Vecchio - Ultramicroscopy, 2020 - Elsevier
In this study, the possibility of utilizing a computer vision algorithm, ie, demons registration,
to accurately remap electron backscatter diffraction patterns for high resolution electron …

Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD

C Ernould, B Beausir, JJ Fundenberger, V Taupin… - Scripta Materialia, 2020 - Elsevier
Abstract Global Digital Image Correlation (DIC) is applied on the electron diffraction patterns
acquired by the “on-axis” Transmission Kikuchi Diffraction (TKD) technique. High-angular …

Integrated correction of optical distortions for global HR-EBSD techniques

C Ernould, B Beausir, JJ Fundenberger, V Taupin… - Ultramicroscopy, 2021 - Elsevier
Optical distortions caused by camera lenses affect the accuracy of the elastic strains and
lattice rotations measured by high-angular resolution techniques. This article introduces an …

Global DIC approach guided by a cross-correlation based initial guess for HR-EBSD and on-axis HR-TKD

C Ernould, B Beausir, JJ Fundenberger, V Taupin… - Acta Materialia, 2020 - Elsevier
Digital image correlation (DIC) techniques usually performed on deforming speckle patterns
are applied here on electron diffraction patterns (EDP) in order to map disorientations with …

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Q Shi, L Jiao, D Loisnard, C Dan, Z Chen… - Materials …, 2022 - Elsevier
Registering experimental and simulated electron diffraction patterns is increasingly used for
advanced electron backscatter diffraction indexation (EBSD) analysis, yet the accuracy of …

[PDF][PDF] Insights into a dual-phase steel microstructure using EBSD and image-processing-based workflow

M Mollens, S Roux, F Hild, A Guery - Journal of Applied …, 2022 - journals.iucr.org
Quantitative metallography to understand the morphology of different crystallographic
phases in a material often rests on the segmentation and classification of electron …