How Industrial Internet Platforms guide high-quality information sharing for semiconductor manufacturing? An evolutionary game model

N Feng, Y Zhang, B Ren, R Dou, M Li - Computers & Industrial Engineering, 2023 - Elsevier
To keep up with the times, the semiconductor manufacturing industry needs to break down
barriers to data transmission. Since the manufacturing process of semiconductor materials is …

An empirical study for smart production for TFT-LCD to empower Industry 3.5

CF Chien, TY Hong, HZ Guo - Journal of the Chinese Institute of …, 2017 - Taylor & Francis
With increasing technological advancements, manufacturing intelligence has become a
crucial issue for maintaining competitive advantages. Industry 4.0, proposed by Germany, is …

Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification

CY Hsu, JC Chien - Journal of Intelligent Manufacturing, 2022 - Springer
Wafer bin maps (WBM) provides crucial information regarding process abnormalities and
facilitate the diagnosis of low-yield problems in semiconductor manufacturing. Most studies …

Standardization: Research Trends, Current Debates, and Interdisciplinarity

F Grillo, PM Wiegmann, HJ de Vries… - Academy of …, 2024 - journals.aom.org
Standards are ubiquitous in contemporary society and play a clear role in technological
development, organizational functioning, and business success. Standards are very diverse …

Mixup-based classification of mixed-type defect patterns in wafer bin maps

W Shin, H Kahng, SB Kim - Computers & Industrial Engineering, 2022 - Elsevier
Wafer bin maps (WBMs) that exhibit systematic defect patterns provide clues for
identification of critical failures that occur during the wafer fabrication process. Proper …

A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems

HW Xu, QH Zhang, YN Sun, QL Chen, W Qin… - Journal of Manufacturing …, 2024 - Elsevier
Abstracts Wafer yield is crucial for assessing semiconductor fabrication enterprises' stability
and technological maturity. Quickly achieving the yield ramp-up of new products and timely …

Dual carbon oriented optimization method for manufacturing industry chain based on BP neural network and clonal selection algorithm

R Dou, Y Hou, Y Wei, J Liu - Applied Soft Computing, 2023 - Elsevier
Global economic growth and increasing carbon emissions pose significant challenges to
managing and optimizing industry chains. Against the backdrop of carbon peak and carbon …

An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing

CF Chien, KH Chang, WC Wang - Journal of Intelligent Manufacturing, 2014 - Springer
To maintain competitive advantages, semiconductor industry has strived for continuous
technology migrations and quick response to yield excursion. As wafer fabrication has been …

Multi-objective multi-population biased random-key genetic algorithm for the 3-D container loading problem

JN Zheng, CF Chien, M Gen - Computers & Industrial Engineering, 2015 - Elsevier
The container loading problem (CLP) has important industrial and commercial application
for global logistics and supply chain. Many algorithms have been proposed for solving the …

Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study

CF Chien, HJ Wu - Journal of Intelligent Manufacturing, 2024 - Springer
Wafer probe test plays a crucial role to distinguish the good dies from the remaining
defected dies on the wafers via the probe card as the testing signal interface between the …