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How Industrial Internet Platforms guide high-quality information sharing for semiconductor manufacturing? An evolutionary game model
N Feng, Y Zhang, B Ren, R Dou, M Li - Computers & Industrial Engineering, 2023 - Elsevier
To keep up with the times, the semiconductor manufacturing industry needs to break down
barriers to data transmission. Since the manufacturing process of semiconductor materials is …
barriers to data transmission. Since the manufacturing process of semiconductor materials is …
An empirical study for smart production for TFT-LCD to empower Industry 3.5
CF Chien, TY Hong, HZ Guo - Journal of the Chinese Institute of …, 2017 - Taylor & Francis
With increasing technological advancements, manufacturing intelligence has become a
crucial issue for maintaining competitive advantages. Industry 4.0, proposed by Germany, is …
crucial issue for maintaining competitive advantages. Industry 4.0, proposed by Germany, is …
Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification
CY Hsu, JC Chien - Journal of Intelligent Manufacturing, 2022 - Springer
Wafer bin maps (WBM) provides crucial information regarding process abnormalities and
facilitate the diagnosis of low-yield problems in semiconductor manufacturing. Most studies …
facilitate the diagnosis of low-yield problems in semiconductor manufacturing. Most studies …
Standardization: Research Trends, Current Debates, and Interdisciplinarity
Standards are ubiquitous in contemporary society and play a clear role in technological
development, organizational functioning, and business success. Standards are very diverse …
development, organizational functioning, and business success. Standards are very diverse …
Mixup-based classification of mixed-type defect patterns in wafer bin maps
W Shin, H Kahng, SB Kim - Computers & Industrial Engineering, 2022 - Elsevier
Wafer bin maps (WBMs) that exhibit systematic defect patterns provide clues for
identification of critical failures that occur during the wafer fabrication process. Proper …
identification of critical failures that occur during the wafer fabrication process. Proper …
A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems
Abstracts Wafer yield is crucial for assessing semiconductor fabrication enterprises' stability
and technological maturity. Quickly achieving the yield ramp-up of new products and timely …
and technological maturity. Quickly achieving the yield ramp-up of new products and timely …
Dual carbon oriented optimization method for manufacturing industry chain based on BP neural network and clonal selection algorithm
R Dou, Y Hou, Y Wei, J Liu - Applied Soft Computing, 2023 - Elsevier
Global economic growth and increasing carbon emissions pose significant challenges to
managing and optimizing industry chains. Against the backdrop of carbon peak and carbon …
managing and optimizing industry chains. Against the backdrop of carbon peak and carbon …
An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing
To maintain competitive advantages, semiconductor industry has strived for continuous
technology migrations and quick response to yield excursion. As wafer fabrication has been …
technology migrations and quick response to yield excursion. As wafer fabrication has been …
Multi-objective multi-population biased random-key genetic algorithm for the 3-D container loading problem
The container loading problem (CLP) has important industrial and commercial application
for global logistics and supply chain. Many algorithms have been proposed for solving the …
for global logistics and supply chain. Many algorithms have been proposed for solving the …
Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study
CF Chien, HJ Wu - Journal of Intelligent Manufacturing, 2024 - Springer
Wafer probe test plays a crucial role to distinguish the good dies from the remaining
defected dies on the wafers via the probe card as the testing signal interface between the …
defected dies on the wafers via the probe card as the testing signal interface between the …