Two-phase degradation process model with abrupt jump at change point governed by Wiener process
D Kong, N Balakrishnan, L Cui - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
Observations on degradation performance are often used to analyze the underlying
degradation process of highly reliable products. From the two-phase degradation path of the …
degradation process of highly reliable products. From the two-phase degradation path of the …
Nonparametric Bayesian reliability analysis of masked data with dependent competing risks
The characteristic of dependence widely exists among different failure modes of systems,
which brings extra difficulty for the reliability analysis. In this paper, a nonparametric …
which brings extra difficulty for the reliability analysis. In this paper, a nonparametric …
On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure
The inverted Dirichlet distribution has been widely used in a variety of applications involving
multivariate categorical data. However, censoring issues leading to implicit forms of …
multivariate categorical data. However, censoring issues leading to implicit forms of …
Statistical inference of adaptive type II progressive hybrid censored data with dependent competing risks under bivariate exponential distribution
Y Du, W Gui - Journal of Applied Statistics, 2022 - Taylor & Francis
Marshall–Olkin bivariate exponential distribution is used to statistically infer the adaptive
type II progressive hybrid censored data under dependent competition risk model. For …
type II progressive hybrid censored data under dependent competition risk model. For …
Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
N Balakrishnan, E Castilla - Journal of Computational and Applied …, 2024 - Elsevier
Data obtained from destructive one-shot devices are usually studied through a binary
response variable indicating failure or success of the device. But, in many practical …
response variable indicating failure or success of the device. But, in many practical …
Reliability modeling for intermittent working system based on Wiener process
H Zhu, X Wang, M **ao, Z Yang, X Tang… - Computers & Industrial …, 2021 - Elsevier
Intermittent working system (IWS) refers to the system which alternates between working
state and storage state. Different from continuous working system, a considerable part of …
state and storage state. Different from continuous working system, a considerable part of …
Reliability estimation for one-shot devices under cyclic accelerated life-testing
A one-shot device, like an automobile airbag, is a product or an equipment that can be used
only once. Better quality and longer lifetime of one-shot devices nowadays increase the cost …
only once. Better quality and longer lifetime of one-shot devices nowadays increase the cost …
Inference for exponential competing risks data under generalized progressive hybrid censoring
L Wang, H Li - Communications in Statistics-Simulation and …, 2020 - Taylor & Francis
In this paper, a competing risks model based on a generalized progressive hybrid censoring
is considered. When the latent lifetime distributions of failure causes are exponential …
is considered. When the latent lifetime distributions of failure causes are exponential …
Optimal design of simple step-stress accelerated life tests for one-shot devices under exponential distributions
MH Ling - Probability in the Engineering and Informational …, 2019 - cambridge.org
This paper considers simple step-stress accelerated life tests (SSALTs) for one-shot devices.
The one-shot device is an item that cannot be used again after the test, for instance …
The one-shot device is an item that cannot be used again after the test, for instance …
Optimal constant-stress accelerated life test plans for one-shot devices with components having exponential lifetimes under gamma frailty models
MH Ling - Mathematics, 2022 - mdpi.com
Optimal designs of constant-stress accelerated life test plans is one of the important topics in
reliability studies. Many devices produced have very high reliability under normal operating …
reliability studies. Many devices produced have very high reliability under normal operating …