Pointwise convolutional neural networks

BS Hua, MK Tran, SK Yeung - Proceedings of the IEEE …, 2018 - openaccess.thecvf.com
Deep learning with 3D data such as reconstructed point clouds and CAD models has
received great research interests recently. However, the capability of using point clouds with …

Accurate estimation of prediction models for operator-induced defects in assembly manufacturing processes

M Galetto, E Verna, G Genta - Quality Engineering, 2020 - Taylor & Francis
The presence of defects in industrial manufacturing may compromise the final quality and
cost of a product. Among all possible defect causes, human errors have significant effects on …

Optimum lot inspection based on lognormal reliability tests

AJ Fernández - International Journal of Production Research, 2023 - Taylor & Francis
Improved lognormal reliability test plans are proposed for lot sentencing. A mixed integer
nonlinear programming problem is stated and solved in order to find the duration of the …

Planning reliability demonstration tests with limited expected risks

AJ Fernandez - Computers & Industrial Engineering, 2022 - Elsevier
Optimal reliability demonstration test plans with controlled expected producer and consumer
risks are computed. Device failure times follow Weibull distributions, whereas prior …

Smart information visualization for first-time quality within the automobile production assembly line

M Gewohn, J Beyerer, T Usländer, G Sutschet - IFAC-PapersOnLine, 2018 - Elsevier
This paper presents a smart information technology framework for an adequate visualization
of assembly-and quality-related information on the vehicle assembly line. Automobile …

The economic production quantity model with optimal single sampling inspection

M Nakhaeinejad - IMA Journal of Management Mathematics, 2024 - academic.oup.com
This paper derives an inspection policy for an economic production quantity (EPQ) model
under the assumption that a process may produce non-conforming (NC) items. In various …

Economic lot sampling inspection from defect counts with minimum conditional value-at-risk

AJ Fernández - European Journal of Operational Research, 2017 - Elsevier
Expected cost functions are often minimized to determine optimal inspection schemes for lot
acceptance purposes. However, minimum mean cost sampling plans usually have high …

Optimal durations of Weibull reliability tests based on failure counts

AJ Fernández - Computers & Industrial Engineering, 2021 - Elsevier
In industry, the durations of reliability experiments are usually fixed in advanced, which
could lead to suboptimal results. A constrained optimization problem is stated in order to …

Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design

AJ Fernández, CD Correa-Álvarez… - European Journal of …, 2020 - Elsevier
Unified Bayesian/frequentist approaches for the design of attributes sampling plans are
introduced by minimizing and limiting a weighted-average of the classical or expected …

Gamma reliability test times with minimal costs and limited risks

AJ Fernández - IEEE Transactions on Reliability, 2021 - ieeexplore.ieee.org
Minimum-cost reliability test durations based on gamma failure count data are found by
solving mixed integer nonlinear programming problems. The optimal numbers of test units …