Analytical modeling and do** optimization for enhanced analog performance in a Ge/Si interfaced nanowire MOSFET

A Das, S Rewari, BK Kanaujia, SS Deswal… - Physica …, 2023 - iopscience.iop.org
This paper critically investigates the effect of do** on different device characteristics of a
Ge/Si interfaced nanowire MOSFET (GSI-NWM) for analog performance enhancement. The …

Design and analysis of polarity controlled electrically doped tunnel FET with bandgap engineering for analog/RF applications

PN Kondekar, K Nigam, S Pandey… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
In this paper, we investigate a polarity controlled electrically doped tunnel FET (ED-TFET)
based on the bandgap engineering for analog/RF applications. The proposed device …

Drain work function engineered do**-less charge plasma TFET for ambipolar suppression and RF performance improvement: a proposal, design, and investigation

BR Raad, D Sharma, P Kondekar… - … on Electron Devices, 2016 - ieeexplore.ieee.org
A novel device configuration is presented for do**-less charge plasma tunnel FET (TFET)
for suppression of ambipolar nature with improved high-frequency figures of merit. For this …

Influence of gate and channel engineering on multigate MOSFETs-A review

R Ramesh - Microelectronics journal, 2017 - Elsevier
The design of CMOS circuits using nanoscale MOSFET has become very difficult nowadays
as device modeling faces new challenges such as short channel effects and mobility …

Low-K dielectric pocket and workfunction engineering for DC and analog/RF performance improvement in dual material stack gate oxide double gate TFET

Dharmender, K Nigam - Silicon, 2021 - Springer
In this paper, we investigate the effect of low K dielectric pocket on DC and analog/RF
performance in dual material stack gate oxide double gate tunnel field effect transistor. For …

Gate-all-around charge plasma-based dual material gate-stack nanowire FET for enhanced analog performance

S Singh, A Raman - IEEE Transactions on Electron Devices, 2018 - ieeexplore.ieee.org
In this paper, a gate-all-around (GAA) charge plasma-based do**less dual material gate
nanowire FET is proposed (CP-DM). This structure is further explored by adding gate-stack …

Analytical modelling and sensitivity analysis of Gallium Nitride-Gate Material and, dielectric engineered-Schottky nano-wire fet (GaN-GME-DE-SNW-fet) based label …

S Sharma, V Nath, SS Deswal, RS Gupta - Microelectronics Journal, 2022 - Elsevier
An analytical model of nanogap embedded Gallium Nitride Gate-Material and Dielectric
Engineered-Schottky Nano-Wire Field Effect Transistor (GaN-GME-DE-SNW-FET) for …

Approach for ambipolar behaviour suppression in tunnel FET by workfunction engineering

K Nigam, P Kondekar, D Sharma - Micro & Nano Letters, 2016 - Wiley Online Library
A dual material control gate tunnel field effect transistor (TFET) for asymmetric do** at
source and drain regions is proposed. The gate consists of three segment different …

Impact of reverse gate oxide stacking on gate all around tunnel FET for high frequency analog and RF applications

A Das, BK Kanaujia, V Nath, S Rewari… - 2020 IEEE 17th India …, 2020 - ieeexplore.ieee.org
We have studied the impact of the reverse gate oxide stacking technique on a typical Gate
All Around Tunnel Field Effect Transistor (GAA TFET). For this, we have compared it's …

Enhanced analog performance and high-frequency applications of dielectric engineered high-K Schottky nanowire FET

S Sharma, A Goel, S Rewari, V Nath, RS Gupta - Silicon, 2022 - Springer
Abstract In this paper, Gallium Nitride (GaN) based Dielectric Engineered High-K GaN
Schottky Nanowire Field Effect Transistor (DE-HK-GaN-SNWFET) is examined for …