One of the most popular methods for reliability assessment of digital circuits is Fault Injection
(FI) in which the behavior of the circuit is simulated in presence of faults. In this paper, we …

Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. The
vulnerability of FPGA-based designs to soft errors is higher than ASIC implementations …

In this paper, we have proposed a fast and easy-to-develop FPGA-based fault injection
technique. This technique uses the Altera FPGAs debugging facilities in order to inject SEU …

Fast, accurate, and detailed Soft Error Rate (SER) estimation of digital circuits is essential for
cost-efficient reliable design. A major step to accurately estimate a circuit SER is the …

Strategies to mitigate soft errors in combinational logic have resulted in large performance
penalties and increases in design time. This study alleviates these issues by using standard …

The application of complex system engineering approaches to cell signaling networks
should lead to novel understandings and, subsequently, new treatments for complex …

Radiation-induced soft errors are the major reliability threat for digital VLSI systems. In
particular, field-programmable gate-array (FPGA)-based designs are more susceptible to …

Scaling complementary metal oxide semiconductor (CMOS) devices has been a method
used very successfully over the last four decades to improve the performance and the …

Soft error tolerant design becomes more crucial due to exponential increase in the
vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER) …