Method of reducing residual contamination in singulated semiconductor die

JM Doub, GM Grivna - US Patent 10,026,605, 2018 - Google Patents
In one embodiment, semiconductor die are singulated from a semiconductor wafer by
placing the semiconductor wafer onto a carrier tape, forming singulation lines through the …

Residue removal from singulated die sidewall

WS Lei, P Kumar, JS Papanu, A Kumar… - US Patent …, 2015 - Google Patents
BACKGROUND 1) Field Embodiments of the present invention pertainto the field of
semiconductor processing and, in particular, to methods of dicing semiconductor wafers …

Via structure and methods thereof

CC Chang, CH Lin - US Patent 10,727,178, 2020 - Google Patents
(57) ABSTRACT A semiconductor device includes a substrate having a chan nel region; a
gate stack over the channel region; a seal spacer covering a sidewall of the gate stack, the …

Wafer dicing with etch chamber shield ring for film frame wafer applications

WS Lei, S Singh, J Dinev, A Iyer, B Eaton… - US Patent …, 2016 - Google Patents
Laser and plasma etch wafer dicing where a mask is formed covering ICs formed on the
wafer, as well as any bumps providing an interface to the ICs. The semiconductor wafer is …

Method of reducing residual contamination in singulated semiconductor die

JM Doub, GM Grivna - US Patent 9,472,458, 2016 - Google Patents
US9472458B2 - Method of reducing residual contamination in singulated semiconductor
die - Google Patents US9472458B2 - Method of reducing residual contamination in …

Laser and plasma etch wafer dicing with a double sided UV-curable adhesive film

MK Chowdhury, WS Lei, T Egan, B Eaton… - US Patent …, 2015 - Google Patents
Laser and plasma etch wafer dicing using UV-curable adhe sive films. A mask is formed
covering ICs formed on the wafer, as well as any bumps providing an interface to the ICs …

Wafer dicing with wide kerf by laser scribing and plasma etching hybrid approach

WS Lei, B Eaton, A Iyer, MR Yalamanchili… - US Patent …, 2014 - Google Patents
BACKGROUND 1) Field Embodiments of the present invention pertain to the? eld of
semiconductor processing and, in particular, to methods of dicing semiconductor wafers …

Multi-layer mask including non-photodefinable laser energy absorbing layer for substrate dicing by laser and plasma etch

WS Lei, MK Chowdhury, T Egan, B Eaton… - US Patent …, 2017 - Google Patents
Page 2 mask is direct-write patterned with a laser scribing process to provide a patterned
mask with gaps. The patterning exposes regions of the substrate between the ICs …

Alternating masking and laser scribing approach for wafer dicing using laser scribing and plasma etch

WS Lei, A Kumar, B Eaton - US Patent App. 14/103,515, 2015 - Google Patents
Alternating masking and laser scribing approaches for wafer dicing using laser scribing and
plasma etch are described. In an example, a method ofdicing a semiconductor wafer having …

Method of reducing residual contamination in singulated semiconductor die

GM Grivna - US Patent 10,916,474, 2021 - Google Patents
(57) ABSTRACT A method for processing electronic die includes providing a substrate
having a plurality of electronic die formed as part of the substrate and separated from each …