A review of nanoparticle decharging in atmospheric pressure plasma afterglows

TJA Staps - Frontiers in Physics, 2022 - frontiersin.org
Plasma afterglows interacting with dust grains present a dynamic environment in which
negatively charged dust grains leaving the plasma bulk experience an environment with …

[HTML][HTML] Physics and applications of dusty plasmas: The Perspectives 2023

J Beckers, J Berndt, D Block, M Bonitz… - Physics of …, 2023 - pubs.aip.org
Dusty plasmas are electrically quasi-neutral media that, along with electrons, ions, neutral
gas, radiation, and electric and/or magnetic fields, also contain solid or liquid particles with …

Spatio-temporal plasma afterglow induces additional neutral drag force on microparticles

JCA van Huijstee, P Blom, ATA Peijnenburg… - Frontiers in …, 2022 - frontiersin.org
An emerging topic in complex plasma physics is the interaction between dust particles and
afterglow plasmas. Control of plasma-particle interactions and specifically of the particle …

EUV-induced hydrogen plasma and particle release

M van de Kerkhof, AM Yakunin, V Kvon… - Radiation Effects and …, 2022 - Taylor & Francis
Extreme UV (EUV) lithography is the most advanced lithography technology for creating the
patterns for state-of-the-art Integrated Circuits (IC), with critical dimensions down to 10 nm …

EUV-induced hydrogen plasma: pulsed mode operation and confinement in scanner

M van de Kerkhof, AM Yakunin… - Journal of Micro …, 2021 - spiedigitallibrary.org
In recent years, EUV lithography scanner systems have entered high-volume manufacturing
for state-of-the-art integrated circuits, with critical dimensions down to 10 nm. This …

[HTML][HTML] Position dependent microparticle charge in a spatiotemporal afterglow plasma

JCA Van Huijstee, P Blom, J Beckers - Physics of Plasmas, 2023 - pubs.aip.org
In the growing field of dusty afterglow plasma physics, the key parameter is the residual
charge of dust particles. However, the particle (de)-charging process in afterglow plasmas is …

EUV lithography technology for high-volume production of semiconductor devices

J Miyazaki, A Yen - Journal of Photopolymer Science and …, 2019 - jstage.jst.go.jp
After years of efforts, extreme-ultraviolet (EUV) lithography reached a significant milestone in
2018: readiness for high-volume production of advanced semiconductor devices. A EUV …

Understanding EUV-induced plasma and application to particle contamination control in EUV scanners

M van de Kerkhof, A Yakunin, V Kvon… - … (euv) lithography xi, 2020 - spiedigitallibrary.org
With the introduction of the NXE: 3400B scanner, ASML has brought EUV to High-Volume
Manufacturing (HVM). In this context, ASML is pursuing a dual-path approach towards zero …

Particulate and molecular contamination control in EUV-induced H2-plasma in EUV lithographic scanner

M van de Kerkhof, E Galutschek… - Systems …, 2020 - spiedigitallibrary.org
In the past year, EUV lithography scanner systems have entered High-Volume
Manufacturing for state-of-the-art Integrated Circuits (IC), with critical dimensions down to 10 …

The impact of hydrogen plasma on the structure and morphology of tin and lead micrometer sized particles

D Shefer, A Nikipelov, M Van de Kerkhof… - Journal of Physics D …, 2023 - iopscience.iop.org
The stability of micrometer sized particles in hydrogen plasma is essential for extreme
ultraviolet lithography, the ITER fusion program and the application of hydrogen plasma …